Check patentability & draft patents in minutes with Patsnap Eureka AI!

Multi-patch matching metallographic map restoration method and device

A repair method and metallographic diagram technology, applied in the field of image processing, can solve problems such as inability to repair metallographic diagrams

Pending Publication Date: 2020-11-20
李松涛
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a multi-patch matching metallographic image repair method and device to improve the problem in the prior art that the metallographic image including large-scale noise cannot be accurately repaired

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multi-patch matching metallographic map restoration method and device
  • Multi-patch matching metallographic map restoration method and device
  • Multi-patch matching metallographic map restoration method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments It is a part of the embodiments of this application, not all of them. The components of the embodiments of the application generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations.

[0031] Accordingly, the following detailed description of the embodiments of the application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely represents selected embodiments of the application. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art w...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a multi-patch matching metallographic map restoration method and device, and relates to the technical field of image processing. The method comprises the following steps: converting a metallographic map into a grayscale image, and enhancing edge information of the grayscale image so as to enhance edge data to determine a to-be-restored region in the metallographic map; compressing the metallographic map to be restored through a discrete cosine pyramid compression algorithm; obtaining a first metallographic diagram to be repaired; carrying out priority judgment on a repaired edge region in the first metallographic map to be repaired through the algorithm provided by the invention; taking the optimal point as a patch center to search for other areas and execute multi-patch rule matching to obtain a second metallographic map to be restored, and finally performing inverse discrete cosine transform decompression on the second metallographic map to be restored to obtain a restored metallographic map. In the implementation process, improvements such as multi-layer pyramid compression, multi-patch optimal matching and Euclidean distance screening are proposed; so that the metallographic image restoration speed and effect are well improved, and the method has high pertinence for the metallographic image restoration problem.

Description

technical field [0001] The invention relates to the technical field of image processing, in particular to a multi-patch matching metallographic image restoration method and device. Background technique [0002] Metallographic diagram is an important digital tool for metal material research, but due to the interference of various external factors in the actual sample preparation and collection process, the effect of metallographic diagram is poor. Automatic quantitative analysis will cause great interference, so it is necessary to repair the metallographic diagram. [0003] At present, most of the restoration work for metallographic diagrams is based on various filtering algorithms, but the basic principle of filtering algorithms determines that this type of restoration method can only be applied to the removal of small-scale noise in metallographic diagrams, and cannot be used in the actual sample preparation process. The large-scale noise introduced is removed. In additio...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06T5/00G06T7/33
CPCG06T7/337G06T2207/20032G06T2207/20052G06T5/77
Inventor 李松涛陈娇李轩泽
Owner 李松涛
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com