Abnormal element detection method for infrared array detector

A technology of infrared array and detection method, applied in instruments, image data processing, computing and other directions, can solve the problems of lack of real-time performance and low degree of automation, and achieve the effect of improving debugging efficiency and easy algorithm

Pending Publication Date: 2020-11-24
西安应用光学研究所
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Problems solved by technology

Existing scene-based flash element detection methods, some need to accumulate a large amount of sampling data, lack real-time performance; some need to establish data sets, and the degree of automation is low

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  • Abnormal element detection method for infrared array detector

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Embodiment Construction

[0015] In order to make the purpose, content, and advantages of the present invention clearer, the specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0016] The technical solution of the present invention: the infrared column detector realizes high-resolution imaging with a large field of view in a scanning manner, and each column (or row) of the image is obtained by imaging the same pixel. Using the imaging characteristics of the infrared line array detector and the neighborhood gray features of the abnormal elements and normal elements, mathematical statistics are carried out, and the position of the abnormal elements is judged according to the statistical results.

[0017] The example of the present invention takes the 576*4 long-wave infrared linear array detector as an example, assuming that the scanning direction is the row direction, and each row of the image ...

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Abstract

The invention discloses an abnormal element detection method for an infrared array detector. The method comprises the following steps of: 1, selecting a sampling point from each row in an input imagesequence; 2, calculating difference values of the gray value of each sampling point and pixels of upper and lower adjacent rows of the sampling point respectively, and summing the absolute values of all the difference values to obtain gray step values of the row and the upper and lower adjacent rows; 3, setting a gray level step threshold, comparing gray level step values obtained by traversal statistics of all rows with the gray level step threshold, and taking pixels with the gray level step values exceeding the gray level step threshold as quasi-abnormal elements; and 4, sorting and listingthe quasi-abnormal elements according to the gray step values, and taking a specified number of quasi-abnormal elements from the list as final abnormal elements. According to the invention, through real-time image analysis and data analysis, blind pixel detection is solved, an algorithm is easy to realize for randomly occurring flash elements, automatic real-time detection can be realized, and the debugging efficiency, the adaptability and the product quality of a thermal imager are greatly improved.

Description

technical field [0001] The invention belongs to the technical field of infrared image processing, and relates to an abnormal element detection method for an infrared line array detector, in particular to automatic real-time detection of abnormal elements such as blind elements and flash elements of an infrared line array detector. Background technique [0002] As the main sensor of the fire weapon system, the thermal imager is mainly used to realize the functions of target detection, tracking, and identification. The infrared detector of its core device is limited by the current material preparation and technology level, as well as the complex working environment and observation scene. Changeable, and the influence of its own temperature and aging, when some pixels are imaged, there will be abnormal responses that have nothing to do with the scene, collectively referred to as abnormal elements. Among them, for the anomalous elements that respond to stable gray levels during ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00
CPCG06T7/0004G06T2207/10048G06T2207/30212
Inventor 杨科王磊磊柯诗剑刘建平康臻薛媛元赵俊成李辉牛静胡铁力郭羽阴万宏
Owner 西安应用光学研究所
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