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Drift correction method and device for photothermal reflection microthermography

A microscopic thermal imaging and drift correction technology, applied in the field of microscopic imaging and image processing, can solve problems such as complex operation and achieve the effect of suppressing acquisition

Active Publication Date: 2021-09-28
THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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  • Claims
  • Application Information

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Problems solved by technology

[0004] In view of this, an embodiment of the present invention provides a drift correction method and device for photothermal reflection microthermography, aiming to solve the problems in the prior art that modulation needs to be applied to the measured object when suppressing drift, and the operation is complicated

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  • Drift correction method and device for photothermal reflection microthermography
  • Drift correction method and device for photothermal reflection microthermography
  • Drift correction method and device for photothermal reflection microthermography

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Embodiment Construction

[0048] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present invention. It will be apparent, however, to one skilled in the art that the invention may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present invention with unnecessary detail.

[0049] In order to illustrate the technical solutions of the present invention, specific examples are used below to illustrate.

[0050] An embodiment of the present invention provides a photothermal reflection microthermography device, such as figure 1 As shown, it includes: adding a modulation plate 1 and a light adjustment device 2 to the original photothermal reflection microthermography device...

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Abstract

The present invention is applicable to the fields of image processing and microscopic imaging, and provides a drift correction method and device for photothermal reflection microscopic thermal imaging. Perform high-pass filtering after the component to obtain the second image; collect the reference image and the image to be corrected and determine the area where the temperature rise occurs; in the area where the temperature does not change, calculate the correction coefficient based on the second image, the reference image and the image to be corrected ; Correct all pixels of the image to be corrected according to the correction coefficient. The photothermal reflection microthermography device adopted in the present invention adds a modulator and a light adjustment device, and performs high-pass filtering after removing the DC component of the first image collected after blocking the optical path on the side of the objective lens, which can effectively suppress the drift of the light source intensity and the camera The responsivity drift collects the reference image and the image to be corrected, and the temperature measurement of the static target can be realized without modulating the temperature of the measured object.

Description

technical field [0001] The invention belongs to the field of image processing and microscopic imaging, and in particular relates to a drift correction method and device for photothermal reflection microscopic thermal imaging. Background technique [0002] Photothermal reflection temperature measurement technology is a non-contact temperature measurement technology based on the phenomenon of photothermal reflection. The basic feature of photothermal reflection phenomenon is that the reflectivity of an object will change with the temperature of the object. When measuring temperature based on photothermal reflection, the illumination system of an optical microscope is used to provide probe light, a high-performance camera is used to record microscopic imaging, and the output camera readings are used as measurement values. However, during the temperature measurement process, the intensity of the detection light will vary randomly, and the responsivity of the camera will also cha...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/00G01J5/08
CPCG01J5/00G01J2005/0077G01J5/48G01J5/80G01J5/0804
Inventor 刘岩吴爱华荆晓冬马春雷杜蕾
Owner THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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