Ultralow-temperature complex electromagnetic parameter testing device for waveguide method microwave dielectric material

A technology of microwave dielectric materials and electromagnetic parameters, which is applied in the direction of measuring devices, magnetic performance measurement, magnetic measurement environment, etc., can solve problems such as insufficient development, and achieve the effect of avoiding waveguide condensation and simple device structure

Active Publication Date: 2021-01-08
INST OF METAL RESEARCH - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the research on ultra-low temperature testing methods and technologies for the electromagnetic properti

Method used

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  • Ultralow-temperature complex electromagnetic parameter testing device for waveguide method microwave dielectric material
  • Ultralow-temperature complex electromagnetic parameter testing device for waveguide method microwave dielectric material
  • Ultralow-temperature complex electromagnetic parameter testing device for waveguide method microwave dielectric material

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Embodiment 1

[0031] Such as figure 1 As shown, a waveguide method microwave dielectric material ultra-low temperature complex electromagnetic parameter testing device according to the present invention is designed by using the rectangular waveguide method test principle. A vacuum heat insulation chamber [3] is set around the outside of the nitrogen refrigeration chamber [2], and an insulation layer [4] of a certain thickness is arranged outside the vacuum insulation chamber [3]. The insulation layer [4] can be in any shape according to actual needs. The test section waveguide [1] has a rectangular cross-section inner cavity at the center and rectangular flanges at both ends. The measured microwave dielectric material [5] that can transmit microwaves is placed in the middle of the test section waveguide [1] inner cavity, and Separate the cavity of the test section waveguide [1] from the middle, and the cross-sectional size of the microwave dielectric material [5] to be tested should be slid...

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Abstract

The invention belongs to the technical field of microwave testing, and particularly relates to an ultralow- temperature complex electromagnetic parameter testing device for a waveguide method microwave dielectric material. A test section waveguide with a rectangular cross section is horizontally arranged, a tested microwave dielectric material capable of transmitting microwaves is placed in the middle of an inner cavity of the test section waveguide, the inner cavity of the test section waveguide is separated from the middle, and the two ends of the test section waveguide are respectively provided with a section of temperature isolation waveguide, namely a temperature isolation waveguide I and a temperature isolation waveguide II, with the same size. A waveguide coaxial converter I is arranged at the outer end of the temperature isolation waveguide I, and a waveguide coaxial converter II is arranged at the outer end of the temperature isolation waveguide II; a liquid nitrogen refrigeration cavity surrounds the test section waveguide, a vacuum heat insulation cavity surrounds the liquid nitrogen refrigeration cavity, and a heat preservation layer is arranged on the outer side of thevacuum heat insulation cavity. A rectangular waveguide method testing principle is adopted, and complex electromagnetic parameter testing of the dielectric material from the room temperature to the ultralow temperature of -165 DEG C or below can be achieved.

Description

technical field [0001] The invention belongs to the technical field of microwave testing, and in particular relates to a testing device for ultra-low temperature complex electromagnetic parameters of microwave dielectric materials by waveguide method. Background technique [0002] Microwave refers to electromagnetic waves with very short wavelengths and high frequencies. It is an alternating electromagnetic field that exists in different media. In a broad sense, its frequency ranges from 300MHz to 3000GHz, that is, electromagnetic waves with wavelengths ranging from 1m to 0.1mm. Both can be called microwaves, but electromagnetic waves with a wavelength of less than 1cm to 0.1mm are usually called millimeter waves and submillimeter waves, while electromagnetic waves with a wavelength of more than 1cm to 1m are called microwaves, and the corresponding frequencies are 300MHz to 30GHz. [0003] In recent years, with the steady advancement of space station construction and lunar ...

Claims

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Application Information

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IPC IPC(8): G01R33/12G01R33/00B01L7/02
CPCG01R33/1253G01R33/007B01L7/02
Inventor 张劲松孙家言李处森马嵩张志东
Owner INST OF METAL RESEARCH - CHINESE ACAD OF SCI
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