Rapid imaging system based on multicolor parallel frequency shift illumination

An imaging system and frequency-shifting technology, applied in the direction of material analysis, measuring devices, instruments, etc. through optical means, can solve the problems that the transmission/reflection microscopic imaging system scheme has not been reported, so as to improve the imaging speed and avoid The effect of missed detection and false detection

Pending Publication Date: 2021-02-05
ZHEJIANG LAB +1
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  • Claims
  • Application Information

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Problems solved by technology

However, the existing FPM imaging schemes all use monochromatic illumination imaging, and are only suitable for transparent samples
[0005] At present, the transmission / reflection microscopic imaging system scheme based on multi-color parallel oblique illumination that can carry out spectral reconstruction and improve the imaging system SBP has not yet been reported.

Method used

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  • Rapid imaging system based on multicolor parallel frequency shift illumination
  • Rapid imaging system based on multicolor parallel frequency shift illumination
  • Rapid imaging system based on multicolor parallel frequency shift illumination

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Embodiment Construction

[0021] The technical solutions of the present invention will be further elaborated below in conjunction with the accompanying drawings and specific embodiments.

[0022] Such as figure 1 As shown, the imaging system based on multicolor parallel frequency shift illumination of the present invention mainly includes a light source, a microscope objective lens 103, a tube lens (not shown in the figure), a multicolor image detector array 108, a control module 111 and a data processing module 112. Wherein, the light source includes a vertical lighting source 105 and more than two groups of oblique lighting sources 101, the same group of oblique lighting sources has the same lighting wavelength, and different groups of oblique lighting sources have different lighting wavelengths; The illumination wavelength of the light source is different, or the same as the illumination wavelength of one of the set of oblique illumination light sources. The inclined illumination light source 101 ...

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Abstract

The invention discloses a rapid imaging system based on multicolor parallel frequency shift illumination. The system comprises a light source, a microscope objective, a tube lens, a multicolor image detector array, a control module and a data processing module, wherein the light source comprises a vertical illumination light source and two or more groups of inclined illumination light sources; theillumination wavelengths of the same group of inclined illumination light sources are the same, and the illumination wavelengths of different groups of inclined illumination light sources are different; and the illumination wavelength of the vertical illumination light source is different from that of any group of inclined illumination light sources, or the illumination wavelength of the verticalillumination light source is the same as that of one group of inclined illumination light sources. According to the invention, the wavelength difference of an illumination light field is utilized, amulticolor inclined illumination light field is applied in parallel through the control module, and the multicolor image detector array is utilized to rapidly acquire the far-field images of an observed sample under various illumination wavelengths in parallel; by means of the data processing module, wide-frequency-band spatial spectrum information of the observed sample is obtained in combinationwith a frequency shift reconstruction algorithm, an image of the observed sample is reconstructed and recovered, and the imaging speed of the whole microscopic system is rapidly increased.

Description

technical field [0001] The invention relates to sample spatial spectrum reconstruction and microscopic imaging, and belongs to the field of microscopic imaging. Background technique [0002] The resolution of traditional microscopic imaging systems is limited by the Abbe diffraction limit, and the spatial resolution of the system cannot be better than half the illumination wavelength. If the observed sample can be illuminated obliquely at a large angle, it is expected to achieve the acquisition of spatial high-frequency information of the observed sample, thereby breaking the diffraction limit and achieving high spatial resolution imaging. [0003] Similar to the dark-field microscopic imaging method, the patent document with the publication number CN102023164A realizes the improvement of system imaging resolution and contrast by externally applying large-angle annular dark-field illumination. However, when using low magnification and low numerical aperture angle (NA) to re...

Claims

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Application Information

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IPC IPC(8): G01N21/88G01N21/958G01N21/01
CPCG01N21/88G01N21/958G01N21/01G01N2021/0112
Inventor 杨青庞陈雷王智徐良殷源王立强刘旭
Owner ZHEJIANG LAB
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