Parallel test task scheduling optimization method, device and computing equipment
A technology for test tasks and test items, which is applied in the field of parallel test task scheduling and optimization, can solve problems such as inability to meet actual needs, and achieve the effect of optimizing the realization time and ensuring traceability.
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Embodiment 1
[0040] figure 1 It shows the process of an embodiment of a method for scheduling optimization of parallel test tasks according to the present application, as figure 1 As shown, the method for optimizing parallel test task scheduling includes:
[0041] S10. Obtain test parameters, wherein the test parameters include test tasks, test items, test resources, expected execution cycle, parent-child relationship between the test items, and preemption priority;
[0042] In a specific embodiment, assuming that the number of test tasks is N, each test task includes M test items, and the type of the test resource is Q, wherein the test tasks are independent of each other during execution, N, M and Q are natural numbers greater than 1.
[0043]For example, set N=3, M=3 and Q=4, that is, three independent test tasks, represented by Task1, Task2 and Task3 respectively; each test task contains three independent test items, represented by Item, namely Task1 includes Item1, Item2, and Item3...
Embodiment 2
[0065] refer to figure 2 , as an implementation of the method for optimizing parallel test task scheduling based on fixed resources, the present application provides an embodiment of a device for optimizing parallel test task scheduling based on fixed resources. figure 1 The method embodiments shown correspond.
[0066] Such as figure 2 As shown, a device for scheduling and optimizing parallel test tasks in this embodiment includes: an acquisition module 10, an entry module 20, a first execution module 30, and a second execution module 40, wherein,
[0067] An acquisition module 10, configured to acquire test parameters, wherein the test parameters include test tasks, test items, test resources, expected execution cycles, parent-child relationships and preemption priorities between the test items;
[0068] The entry module 20 is configured to automatically enter the test parameters into a relational database, the relational database is configured as a test requirement form...
Embodiment 3
[0078] image 3 A schematic structural diagram of a computing device provided by another embodiment of the present application is shown. image 3 The displayed computing device 50 is only an example, and should not impose any limitation on the functions and scope of use of the embodiments of the present application.
[0079] Such as image 3 As shown, computing device 50 takes the form of a general-purpose computing device. Components of computing device 50 may include, but are not limited to: one or more processors or processing units 500 , system memory 516 , bus 501 connecting various system components including system memory 516 and processing unit 500 .
[0080] Bus 501 represents one or more of several types of bus structures, including a memory bus or memory controller, a peripheral bus, an accelerated graphics port, a processor, or a local bus using any of a variety of bus structures. These architectures include, by way of example, but are not limited to Industry St...
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