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Fabric defect detection method in warp knitting process

A detection method and defect technology, applied in manufacturing computing systems, image analysis, image enhancement, etc., can solve problems such as resource waste and poor efficiency, and achieve the effects of improving applicability, stability, and robustness

Active Publication Date: 2021-02-12
TIANJIN UNIV
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AI Technical Summary

Problems solved by technology

However, the timeliness of manual inspection is poor. When workers find fabric defects, the machine tool has often produced a long period of defective fabric, resulting in waste of resources.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
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  • Fabric defect detection method in warp knitting process
  • Fabric defect detection method in warp knitting process
  • Fabric defect detection method in warp knitting process

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Embodiment Construction

[0027] The present invention is described below in conjunction with accompanying drawing;

[0028] The invention designs a fast detection algorithm for fabric defects in the warp knitting process, figure 1 It is the processing flowchart of the algorithm of the present invention, which is divided into two parts: the automatic calculation of the region of interest and the detection of fabric defects; for each picture collected, the computer automatically calculates the region of interest of the picture first, that is, the weaving of the warp knitting machine area, and then cut the size of the region of interest from the collected pictures, perform defect detection on the cropped pictures, and alarm or shut down after detecting the defects.

[0029] The processing flowchart of the region of interest automatic positioning algorithm mentioned in the present invention is as figure 2 As shown; the automatic positioning algorithm of the region of interest is divided into two parts: ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
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Abstract

The invention relates to a fabric defect detection method in a warp knitting process. The fabric defect detection method comprises the following steps: (1) collecting a needle bed movement process picture; (2) for the collected first picture, calculating a region of interest of the picture; (3) cutting all shot pictures into the range of the region of interest by using the calculated coordinates of the region of interest; and (4) performing defect detection on the region of interest of the image.

Description

technical field [0001] This algorithm relates to a fabric defect detection algorithm in the process of warp knitting. Background technique [0002] In the textile industry, warp knitting machines are widely used. However, due to the quality of the yarn and other reasons, yarn breakage will inevitably occur during the weaving process, resulting in fabric defects and affecting the quality of the final finished fabric. At present, the detection of fabric defects by most textile enterprises is still in the stage of manual detection. However, the timeliness of manual inspection is poor. When workers find fabric defects, the machine tool has often produced a long period of defective fabric, resulting in waste of resources. Nowadays, my country is in an important period of industrial structure transformation, and the traditional textile industry is also developing in the direction of intelligence and automation. There is an urgent need for online detection of fabric defects in the...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T5/00G06T7/12G06T7/136G06T7/181
CPCG06T7/0008G06T7/181G06T7/136G06T7/12G06T2207/10004G06T2207/20024G06T5/70Y02P90/30
Inventor 张效栋杨宏脉朱琳琳闫宁李娜娜
Owner TIANJIN UNIV
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