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Method and system for collecting parameters of nano material

A technology for obtaining nanomaterials and parameters, which can be used in special data processing applications, instruments, biological neural network models, etc., and can solve complex problems

Pending Publication Date: 2021-04-30
SUZHOU UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The traditional design process involves the selection of synthetic components and dispersions, often complex

Method used

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  • Method and system for collecting parameters of nano material
  • Method and system for collecting parameters of nano material
  • Method and system for collecting parameters of nano material

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Embodiment Construction

[0028] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following briefly introduces the drawings that need to be used in the description of the embodiments. However, it will be apparent to those skilled in the art that the present application may be practiced without these details. In other instances, well-known methods, procedures, systems, components and / or circuits have been described at a high level in order to avoid unnecessarily obscuring aspects of the application. It will be apparent to those skilled in the art that various changes may be made to the disclosed embodiments, and that the general principles defined herein may be applied to other applications without departing from the principles and scope of the application. Examples and application scenarios. Thus, the application is not limited to the embodiments shown, but is to be accorded the widest scope consistent with the claims.

[0029] The termino...

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Abstract

The invention relates to a method and a system for collecting parameters of a nano material. The method includes the steps of obtaining a desired scattering spectrum of a target nanomaterial; determining target information of the target nano material by utilizing the model after first training based on the expected scattering spectrum, the target nano material being a nano particle with a spherical shell structure composed of a central core and at least one layer of shell, and the nano particle being a nano particle with a spherical shell structure. Wherein the target information comprises at least one of a target structure parameter, a target material parameter or a target temperature of the target nano material.

Description

technical field [0001] The present application relates to methods and systems for designing nanomaterials, and more particularly, to methods and systems for acquiring parameters of nanomaterials based on machine learning. Background technique [0002] The reverse design of nanomaterials based on the scattering spectrum of nanomaterials (also known as parameter acquisition of nanomaterials) and the regulation of scattering phenomena of nanomaterials (such as super-scattering phenomenon, stealth phenomenon) are important research topics in nanophotonics. . The traditional design process involves the selection of synthetic components and dispersions, which are often complex. Accordingly, it is desirable to provide methods and systems for parameter acquisition of nanomaterials. Contents of the invention [0003] In the first aspect of the present application, a method for obtaining parameters of a nanomaterial is provided, including: obtaining an expected scattering spectrum...

Claims

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Application Information

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IPC IPC(8): G06F30/20G06N20/00G06N3/04
CPCG06F30/20G06N20/00G06N3/044G06N3/045
Inventor 黄敏罗杰詹耀辉肖仲喆李洵章新源郭佳洁
Owner SUZHOU UNIV