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Millimeter wave and terahertz wave electric field measurement method, device and system

A measurement method and millimeter wave technology, applied in the field of measurement, can solve the problems affecting the accuracy of electric field measurement, light field interference, etc.

Active Publication Date: 2021-05-14
QINGYUAN TIANZHIHENG SENSING TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

When the wavelength of the electromagnetic wave is in the range of 10G-500GHz, its wavelength becomes smaller, and the standing wave phenomenon generated by the electromagnetic wave irradiating on the wall will interfere with the optical field of the last measured probe light, affecting the accuracy of the electric field measurement

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  • Millimeter wave and terahertz wave electric field measurement method, device and system
  • Millimeter wave and terahertz wave electric field measurement method, device and system
  • Millimeter wave and terahertz wave electric field measurement method, device and system

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Embodiment Construction

[0038] In order to better understand the purpose, technical solution and technical effect of the present invention, the present invention will be further explained below in conjunction with the accompanying drawings and embodiments. At the same time, it is stated that the embodiments described below are only used to explain the present invention, and are not intended to limit the present invention.

[0039] An embodiment of the present invention provides a method for measuring electric fields of millimeter waves and terahertz waves.

[0040] figure 1 It is a flow chart of an embodiment of a millimeter wave and terahertz wave electric field measurement method, such as figure 1 As shown, the millimeter wave and terahertz wave electric field measurement method in one embodiment includes step S100 to step S102:

[0041] S100, obtaining the amplitude value of the standing wave in the atomic bubble cavity to the amplitude of the electromagnetic wave, so as to determine the correct...

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Abstract

The invention relates to a millimeter wave and terahertz wave electric field measurement method, device and system, and the method comprises the steps: obtaining an amplification value of a standing wave in an atomic bubble cavity on the amplitude of an electromagnetic wave, determining a correction coefficient, then moving the measurement value determined by a standing wave period in a glass probe along the diameter direction according to detection light, and finally, correcting the measurement value according to the correction coefficient to obtain the millimeter wave and terahertz wave electric field values. On the basis, the millimeter wave electric field value and the terahertz electric field value are obtained after the measurement value is corrected through the correction coefficient, interference caused by the standing wave phenomenon can be reduced, and the measurement accuracy of the millimeter wave electric field value and the terahertz electric field value is improved.

Description

technical field [0001] The invention relates to the field of measurement technology, in particular to a method, device and system for measuring millimeter wave and terahertz wave electric fields. Background technique [0002] Millimeter waves refer to electromagnetic waves whose wavelength range is on the order of millimeters and whose corresponding frequency ranges from tens of GHz to hundreds of GHz. Terahertz wave (TeraHertz, THz) frequency band refers to the electromagnetic radiation area with a frequency ranging from a few tenths to a dozen THz, which is quite wide between millimeter waves and infrared light. The development of THz and millimeter wave field strength measuring instruments and equipment is relatively slow due to the high technical difficulty, resulting in a relatively lagging behind in this technology research. The precise measurement of electromagnetic field strength and polarization direction has great research significance in communication, remote sen...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/08
CPCG01R29/0807
Inventor 张新定廖开宇颜辉
Owner QINGYUAN TIANZHIHENG SENSING TECH CO LTD