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A single-dimensional pixel binning mode equivalent narrow area array camera spatial position measurement method

A technology of spatial position and measurement method, applied in measurement devices, image communication, optical devices, etc., can solve the problems of small aperture diaphragm, small incoming light, large volume, etc., and achieve high sampling rate, sensitivity, and data volume. Reduced, bulky effect

Active Publication Date: 2021-12-28
BEIHANG UNIV
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Problems solved by technology

[0005] However, under high dynamic conditions, both the traditional binocular area array camera measurement system and the three-line array camera measurement system have certain defects.
For the binocular area array camera measurement system, factors such as high-resolution image acquisition transmission and image processing time of the area array camera limit the system measurement rate, and high frame rate cameras are often expensive and bulky
For a three-line array camera, a cylindrical lens is used to compress the imaging field of view in the normal direction of the pixel arrangement to one point, which makes the measurement target susceptible to interference, and cannot achieve multi-target imaging due to target aliasing, and can only be illuminated circularly; at the same time, the line The imaging principle of the array camera based on the cylindrical mirror will result in a small lens aperture stop and small light input, so that the measured target must use high-brightness luminous characteristics, which limits its application range
[0006] It can be seen that the traditional binocular area array camera measurement system and the three-line array camera measurement system have their own shortcomings, and it is difficult to balance the various requirements of dynamic and precise spatial position measurement

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  • A single-dimensional pixel binning mode equivalent narrow area array camera spatial position measurement method
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  • A single-dimensional pixel binning mode equivalent narrow area array camera spatial position measurement method

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Embodiment Construction

[0023] The embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to define the protection scope of the present invention more clearly.

[0024] Such as Figure 1-2 As shown, a spatial position measurement method based on a single-dimensional pixel binning (binning) mode equivalent narrow array camera, using binning mode equivalent narrow array imaging to achieve high-speed measurement capabilities; using a three-camera combination measurement The method realizes the high precision of measurement, involving binning mode imaging method and trinocular combination, equivalent narrow array trinocular vision measurement model, equivalent narrow area array trinocular vision measurement system camera internal parameters and external parameter calibration, narrow area array image processing method, ...

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Abstract

The invention provides a single-dimensional pixel binning mode equivalent narrow array camera spatial position measurement method, including using three area array industrial cameras to establish a trinocular vision measurement system, and each camera is constructed into an equivalent narrow array through binning in different directions Imaging, collecting the target image, extracting the sub-pixel center position of the feature mark under the narrow array image, and calculating the spatial position coordinates of the feature mark in the coordinate system of the measurement system according to the calibration results of the internal parameters and external parameters of the trinocular camera. The present invention provides a precise dynamic space position measurement method between area array and line array vision. The equivalent narrow area array camera based on single-dimensional binning mode realizes space position measurement through trinocular combination, which meets the high-precision and high-speed measurement requirements. , which is of great significance to dynamic and precise spatial position measurement.

Description

technical field [0001] The invention belongs to the field of dynamic and precise spatial position measurement, and in particular relates to a method for measuring the spatial position of an equivalent narrow array camera based on a single-dimensional pixel merging mode (ie, binning). Background technique [0002] Dynamic and precise spatial position measurement is an important field of mechanical testing, and it is widely used in aircraft wind tunnel testing, ship towing testing, large-scale component assembly, and motion process monitoring. [0003] Dynamic and precise spatial position measurement puts forward higher requirements for the measurement system: first, high spatial resolution is required, and high resolution is an important prerequisite for precise spatial position measurement; second, the sampling rate is high, and the measurement system must have sufficient The sampling rate is high to capture the detail changes in the target movement process; the third is hig...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/00H04N5/232
CPCG01B11/002H04N23/667
Inventor 高扬崔恒宇王旭
Owner BEIHANG UNIV
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