A single-dimensional pixel binning mode equivalent narrow area array camera spatial position measurement method
A technology of spatial position and measurement method, applied in measurement devices, image communication, optical devices, etc., can solve the problems of small aperture diaphragm, small incoming light, large volume, etc., and achieve high sampling rate, sensitivity, and data volume. Reduced, bulky effect
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[0023] The embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to define the protection scope of the present invention more clearly.
[0024] Such as Figure 1-2 As shown, a spatial position measurement method based on a single-dimensional pixel binning (binning) mode equivalent narrow array camera, using binning mode equivalent narrow array imaging to achieve high-speed measurement capabilities; using a three-camera combination measurement The method realizes the high precision of measurement, involving binning mode imaging method and trinocular combination, equivalent narrow array trinocular vision measurement model, equivalent narrow area array trinocular vision measurement system camera internal parameters and external parameter calibration, narrow area array image processing method, ...
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