Unlock instant, AI-driven research and patent intelligence for your innovation.

Thin film transistor array substrate for digital x-ray detector device and digital x-ray detector device including the same

A technology of thin film transistors and array substrates, which is applied in the field of digital X-ray detector devices, can solve the problems of difficulty in storing and saving printed films, and it takes a long time.

Pending Publication Date: 2021-06-08
LG DISPLAY CO LTD
View PDF0 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, checking the results takes a long time
In particular, in film printing scenarios, there are some difficulties in storing and preserving printed film

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Thin film transistor array substrate for digital x-ray detector device and digital x-ray detector device including the same
  • Thin film transistor array substrate for digital x-ray detector device and digital x-ray detector device including the same
  • Thin film transistor array substrate for digital x-ray detector device and digital x-ray detector device including the same

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] Some embodiments of the present disclosure are described in detail with reference to the accompanying drawings. Therefore, those skilled in the art to which the present disclosure pertains can easily realize the technical idea of ​​the present disclosure. In the description of the present disclosure, if it is determined that a detailed description of known technology related to the present disclosure unnecessarily obscures the gist of the present disclosure, the detailed description may be omitted. One or more embodiments of the present disclosure are described in detail with reference to the accompanying drawings. In the drawings, the same reference numerals may be used to designate the same or similar parts.

[0031] Herein, the terms "on", "under", "on", "below" etc. are used such that in the case where the first component is arranged at the "upper" or "lower" of the second component Next, the first part may be arranged in contact with the upper surface (or lower s...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a thin film transistor array substrate for a digital X-ray detector device, wherein the thin film transistor array substrate includes a base substrate; a plurality of data lines and a plurality of gate lines disposed on the base substrate and arranged to cross each other; a driving thin film transistor disposed above the base substrate and including a first electrode, a second electrode, a gate electrode and an active layer; a PIN diode connected to the driving thin film transistor; and at least one shielding layers disposed above the driving thin film transistor and configured to overlay the active layer, wherein the at least one shielding layers are electrically connected to the plurality of data lines.

Description

technical field [0001] The present disclosure relates to a thin film transistor array substrate for a digital X-ray detector device and a digital X-ray detector device including the thin film transistor array substrate capable of causing a negative shift phenomenon of the threshold voltage of an element minimized. Background technique [0002] Since X-rays have short wavelengths, X-rays can easily pass through objects. The transmittance of X-rays depends on the internal density of the object. Therefore, it is possible to observe the internal structure of an object by detecting the amount of X-rays transmitted through the object. [0003] One of the X-ray based inspection methods used in the medical field is the film printing scheme. However, in the film printing scheme, in order to check the result, an image is taken, and then the film is printed. Therefore, checking of the results takes a long time. Especially, in the film printing scheme, there are some difficulties i...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L27/146G01T1/24G01T1/20
CPCH01L27/14663H01L27/14623H01L27/14612G01T1/243G01T1/2018H01L27/14658H01L27/14609H01L27/1214H01L27/14676H01L31/105H01L31/115H01L31/1055H04N25/766
Inventor 尹载皓姜汶秀张栋现朴時亨
Owner LG DISPLAY CO LTD
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com