Software and hardware combined embedded equipment and method

Abstract

The invention discloses software and hardware combined embedded equipment and a method, and belongs to the field of high-reliability storage. The software and hardware combined high-reliability storage method comprises the steps that after equipment is powered on, a processor loads and runs a bootloader program, the bootloader achieves verification of a software program and a software program backup, and a verification result is stored in a self-checking RAM area; the software program or the backup program which is verified to be correct is selected to be loaded, and the loaded software program reads the self-checking result stored in the RAM area; if one software program has an error, the error program is repaired by using a non-inductive repair method, and meanwhile, the storage reliability of the software program is improved by adopting an true and false flower code method and a code clearing method. According to the method, the storage reliability is improved from two aspects of hardware and software, and compared with other storage reliability design only through software or hardware, the method has the advantages of longer data retention period, low cost and the like.

Description

technical field [0001] The invention belongs to the field of highly reliable storage, in particular to an embedded device and method combining software and hardware. Background technique [0002] Existing high-reliability storage product designs are mainly realized by using built-in EDAC storage devices and hardware redundancy backup, which usually have high costs and complex design structures. During the product life cycle, due to occasional defects in the manufacturing process of the storage device itself, the data retention capacity is reduced, resulting in the stored "data bit change"; the power supply fluctuates abnormally during system use, resulting in "data being rewritten abnormally", which will cause the system invalidated. In the field of high-reliability storage applications, these two types of faults cannot be eliminated in device screening and product testing, and will cause huge losses if they occur during product use. At present, these two types of faults c...

AI Technical Summary

Problems solved by technology

[0002] Existing high-reliability storage product designs are mainly realized by using built-in EDAC storage devices and hardware redundancy backup, usually with high cost and complicated design structure

During the service life of the product, due to occasional defects in the manufacturing process of the storage device itself, the data retention capability is reduced, resulting in the stored "data bit change"; the power supply fluctuates abnormally during system use, resulting in "data being rewritten abnormally", which will cause the system fail

In the field of high-reliability storage applications, these two types of faults cannot be eliminated in device screening and product testing, and will cause huge losses if they occur during product use

At present, these two kinds of failures cannot be effectively solved by existing embedded device storage design

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