Multilayer detachable constant-temperature porous medium seepage test device suitable for PIV (particle image velocimetry)
A technology of porous media and test equipment, which is applied in the direction of measurement equipment, suspension and porous material analysis, permeability/surface area analysis, etc., can solve problems affecting shooting effects, lens damage, etc., and achieve the effect of flexible sample preparation and sampling
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0026] The device structure and specific embodiments of the present invention will be further described below with reference to the accompanying drawings.
[0027] like figure 1 As shown, the device includes a constant temperature seepage loading system (1), a seepage model box (2), a seepage pressure measurement system (3), and a water quality monitoring system (4). The seepage test loading system (1), seepage pressure measurement system (3), the water quality monitoring system (4) is respectively connected with the seepage model box (2); the seepage test column in the seepage test model box (2) is connected from top to bottom by the inflow box chamber (2-1), The first seepage section box chamber (2-2), the second seepage section box room (2-3), the third seepage section box room (2-4) and the outflow box room (2-5) are formed, which are adjacent to each other up and down The chambers are detachably connected, and the aperture plate (2-10) and the filter screen (2-11) can be s...
PUM
Property | Measurement | Unit |
---|---|---|
transmittivity | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com