Electrical performance test method of solar cell

Abstract

An electrical performance test method of a solar cell belongs to the field of solar cell testing. The method comprises the following steps: testing the series resistance Rs of the solar cell to be tested; measuring a light current value Iph under a bright field condition; calculating a voltage value Up and a current value Ip under an equivalent bright field condition; and obtaining a test result according to the equivalent bright field IV curve or the voltage value and the current value under the equivalent bright field condition, wherein the test time under the dark field condition is longer than the test time under the bright field condition. The dark field IV test time is prolonged, and the influence of the solar cell capacitance effect on the electrical performance test result is eliminated; as the test of the photo-generated current is hardly influenced by the capacitive effect, equivalently, the two ends of the capacitor are short-circuited so that the bright field test time can be very short; and the dark field IV test time is prolonged, the burden of a light source does not need to be increased, a temperature rise caused by light irradiation on the battery is avoided, and the test deviation caused by the capacitance effect can be effectively reduced under the condition that the light irradiation time is not obviously increased.

Description

technical field [0001] The invention belongs to the field of solar cell testing, in particular to a method for testing the electrical properties of a solar cell. Background technique [0002] The solar cell can generate electricity when it is irradiated by light. It is essentially a p-n junction. Sunlight shines on the semiconductor p-n junction to form new hole-electron pairs. Under the action of the built-in electric field of the p-n junction, the photogenerated holes flow to p In the area, the photogenerated electrons flow to the n area, and a current is generated after the circuit is connected; this is the working principle of the photoelectric effect solar cell. [0003] According to semiconductor knowledge, p-n junctions have diffusion capacitance and barrier capacitance, so solar cells also have capacitive effects, which will affect the electrical performance test results of solar cells; electrical performance tests of solar cells include bright field under light cond...

AI Technical Summary

Problems solved by technology

[0005] The present invention aims to solve the above problems, and provides a solar cell that can effectively reduce the test deviation caused by the capacitive effect without significantly increasing the light irradiation time. Electrical performance test method

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