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Product defect detection equipment and method

A product defect and detection method technology, applied in the direction of kernel method, neural learning method, other database retrieval, etc., can solve the problems of high cost of data privacy protection, large amount of garbage data, data isolation and data dispersion, etc.

Active Publication Date: 2021-07-02
BEIJING INSTITUTE OF TECHNOLOGYGY
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When performing defect detection on the data-driven MES-oriented product surface, there are poor data quality in the existing technology (more junk data, missing some data labels), insufficient database samples, data isolation and data dispersion caused by data islands, data Lack of shared security, high cost of data privacy protection, etc.

Method used

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  • Product defect detection equipment and method
  • Product defect detection equipment and method
  • Product defect detection equipment and method

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Embodiment Construction

[0052] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0053]The purpose of the present invention is to provide a method to solve the problem that data is not easy to share in the era of "big data" while ensuring the security of each client device, thereby protecting the security of the data, and at the same time, it can also use secret-related defects data, making the defect data richer and the model more accurate.

[0054] In order to make the above objects, features and advantages of the present invention more ...

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Abstract

The invention relates to a product defect detection method and equipment. The product defect detection method comprises the following steps: according to obtained sample data of a model construction participant, training a data model according to a data model training instruction to obtain an intermediate parameter, and encrypting the intermediate parameter; decrypting the encrypted intermediate parameters, and fusing the decrypted intermediate parameters to obtain fused parameters; and then, updating model parameters of the data model according to the fusion parameters, and obtaining a product defect detection classification model with industrial product data as input and a product surface defect detection result as output. The problem that data in the age of big data are not easy to share is solved, the data safety is further protected, meanwhile, defect data are richer, and the model is more accurate.

Description

technical field [0001] The invention relates to the field of product defect detection, in particular to an MES-oriented product defect detection device and method based on federated learning. Background technique [0002] The manufacturing execution system (MES) is designed to help major companies realize detailed process scheduling, production unit allocation, manufacturing resource allocation and status reporting, document control, product tracking and product list management, data collection, product quality management, Workshop inventory management, etc., are conducive to solving the visualization and controllability of the factory production process, and improving the level and ability of manufacturing execution. Among them, product surface defect detection is an important part of product quality management. [0003] In the context of the industrial Internet, artificial intelligence is developing rapidly with a large amount of labeled data. When performing defect detec...

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Application Information

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IPC IPC(8): G06F16/906G06N20/00G06N20/10G06N3/08G06F21/62G06F21/60G06Q10/06G06Q50/04
CPCG06F16/906G06N20/00G06N20/10G06N3/08G06F21/6245G06F21/602G06Q10/06395G06Q50/04Y02P90/30
Inventor 柴森春王昭洋徐灿灿张百海崔灵果李慧芳姚分喜
Owner BEIJING INSTITUTE OF TECHNOLOGYGY