Product defect detection equipment and method
A product defect and detection method technology, applied in the direction of kernel method, neural learning method, other database retrieval, etc., can solve the problems of high cost of data privacy protection, large amount of garbage data, data isolation and data dispersion, etc.
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[0052] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0053]The purpose of the present invention is to provide a method to solve the problem that data is not easy to share in the era of "big data" while ensuring the security of each client device, thereby protecting the security of the data, and at the same time, it can also use secret-related defects data, making the defect data richer and the model more accurate.
[0054] In order to make the above objects, features and advantages of the present invention more ...
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