Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A multi-channel correlated low-frequency noise testing device and analysis method

A low-frequency noise and testing device technology, applied in measurement devices, spectrum analysis, noise figure or signal-to-noise ratio measurement, etc. Effects of Common Mode Noise

Active Publication Date: 2022-05-03
GUANGZHOU GRG METROLOGY & TEST CO LTD
View PDF13 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] In order to overcome the deficiencies in the above-mentioned prior art, the purpose of the present invention is to provide a multi-channel related low-frequency noise testing device and analysis method, so that the generation of noise can be better analyzed by measuring the noise of the two channels respectively stage, it helps to better extract the spectrum characteristics, and at the same time, by using the spectrum transfer characteristics, the elimination of common mode noise between channels can be realized, and the problem of common mode noise that cannot be eliminated in the traditional measurement process can be solved

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A multi-channel correlated low-frequency noise testing device and analysis method
  • A multi-channel correlated low-frequency noise testing device and analysis method
  • A multi-channel correlated low-frequency noise testing device and analysis method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0038] The implementation of the present invention is described below through specific examples and in conjunction with the accompanying drawings, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific examples, and various modifications and changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0039] image 3 It is a system architecture diagram of a multi-channel correlated low-frequency noise testing device of the present invention. Such as figure 1 As shown, a multi-channel related low-frequency noise testing device of the present invention includes: a device under test module 10 , a first noise test path 20 , a second noise test path 30 and a spectrum analysis module 40 .

...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a multi-channel related low-frequency noise testing device and analysis method. The testing device includes: a device to be tested module, which is used to provide an external bias voltage for the device to be tested and introduce noise that needs to be paid attention to by the device to be tested. signal and output; the first noise test path is used to amplify and digitally sample the first small signal noise output by the DUT module to obtain the first digital noise signal; the second noise test path is used to Amplifying and digitally sampling the second small signal noise output by the device-under-test module to obtain a second digital noise signal; the spectrum analysis module is used to calculate each channel separately for each channel according to the sampled two-channel data noise spectrum, and then perform correlation analysis or noise elimination between the two channels.

Description

technical field [0001] The invention relates to the technical field of low-frequency noise testing, in particular to a multi-channel related low-frequency noise testing device and analysis method. Background technique [0002] With the continuous improvement of the precision of electronic equipment, higher requirements are put forward for the stability of the device. The internal noise of the device has become a key factor restricting high-precision equipment. The fluctuation of carriers inside the device forms the main noise of the device. Therefore, carrying out device noise test and analysis has become one of the key means to measure the quality of the device. At the same time, there is a close relationship between the low-frequency noise characteristics of the device and the reliability of the device. It is of great significance to carry out the test and analysis of the low frequency noise of the device. [0003] Low-frequency noise test equipment is currently mainly ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R29/26G01R23/177
CPCG01R29/26G01R23/177
Inventor 岳龙明志茂陆裕东刘远李汝冠江雪晨毛景雄
Owner GUANGZHOU GRG METROLOGY & TEST CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com