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PCIe test fixture code pattern automatic switching method and device

A test fixture and automatic switching technology, applied in the field of PCIe interface testing, can solve problems such as inconvenience and increase the workload of test engineers, and achieve the effect of facilitating testing and reducing workload.

Inactive Publication Date: 2021-08-24
SHENZHEN WELLTEST TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The related method is to switch the rate manually, but this method requires someone to be on-site to test, which increases the workload of the test engineer and has the disadvantage of being inconvenient

Method used

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  • PCIe test fixture code pattern automatic switching method and device

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Effect test

Embodiment Construction

[0042] The application will be described in further detail below in conjunction with the accompanying drawings.

[0043] First aspect, refer to figure 1 , a PCIe test fixture pattern automatic switching method, comprising the following steps:

[0044] S1. The board to be tested is connected to the test fixture through the PCIe interface, and the test fixture is connected to an oscilloscope for obtaining waveform signals;

[0045] S2. The pulse source is connected to the board to be tested as the pulse source.

[0046] Also includes the following steps:

[0047] S3. The pulse source inputs the pulse signal to the lane0 end of the PCIe port of the board to be tested through the switch switch;

[0048] S4, connect the Rx lane0 end of the test fixture with the output end of the switch switch;

[0049] S5. The MCU sends a control signal to the switch switch through the EN terminal to automatically control the switching of the switch switch, and completes a PCIe rate switching e...

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PUM

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Abstract

The invention relates to the technical field of PCIe interface testing, in particular to a PCIe test fixture code pattern automatic switching method, which comprises the following steps that a board to be tested is connected with a test fixture through a PCIe interface, and the test fixture is connected with an oscilloscope used for acquiring waveform signals; the pulse source serves as a pulse source by accessing a to-be-tested board; the pulse source inputs a pulse signal to the lane0 end of the PCIe port of the board to be tested through the switch switch; the Rx lane0 end of the test fixture is connected with the output end of the switch switch; the MCU sends a control signal to the switch switch through the EN end so as to automatically control the switch-on and switch-off of the switch switch, and PCIe rate switching is completed once every time a pulse is switched on and off; and the corresponding waveform signal is stored after each PCIe rate switching through the oscilloscope. According to the method, manual rate switching is not needed, the workload of a test engineer is reduced, and the test is convenient.

Description

technical field [0001] The present application relates to the technical field of PCIe interface testing, in particular to a PCIe test fixture pattern automatic switching method and a device thereof. Background technique [0002] PCI-Express (Peripheral Component Interconnect Express) is a high-speed serial computer expansion bus standard, referred to as PCIe. Compared with previous standards, PCIe has higher maximum system bus throughput, lower I / O pin count and smaller physical size, while PCIe has better bus device performance scaling and more detailed error detection and reporting mechanism (advanced error reporting) and native hotplug capability. [0003] PCIe adopts the principle of voltage differential transmission, that is, two signal lines, and the voltage difference between them is used as the expression of logic "0" and "1". Transmission in this way can greatly increase the transmission frequency and make the signal easy to read. Noise impact is reduced. [0004...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R1/20H04L12/26
CPCG01R31/00G01R1/206H04L43/50
Inventor 余守军
Owner SHENZHEN WELLTEST TECH CO LTD
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