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Device and method for measuring influence of ion density on relative dielectric constant

A technology of relative permittivity and ion density, applied in measuring devices, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve the problem that the influence of ion density cannot be ignored, the influence of ion density cannot be measured, and ion density cannot be accurately controlled. And other issues

Active Publication Date: 2021-08-27
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0004] For most plasma sources, the plasma is generated by colliding electrons and neutral gas by means of an external electric field. In this process, the ion density cannot be precisely controlled.
Therefore, in the process of plasma diagnosis, the influence of ion density on plasma dielectric constant cannot be ignored, let alone the influence of ion density on plasma dielectric constant cannot be measured

Method used

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  • Device and method for measuring influence of ion density on relative dielectric constant
  • Device and method for measuring influence of ion density on relative dielectric constant
  • Device and method for measuring influence of ion density on relative dielectric constant

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Embodiment Construction

[0089] The specific embodiments of the present invention are described below so that those skilled in the art can understand the present invention, but it should be clear that the present invention is not limited to the scope of the specific embodiments. For those of ordinary skill in the art, as long as various changes Within the spirit and scope of the present invention defined and determined by the appended claims, these changes are obvious, and all inventions and creations using the concept of the present invention are included in the protection list.

[0090] Such as figure 1 As shown, the present invention provides a device for measuring the influence of ion density on relative permittivity, including a main control device, a hollow cavity structure, a radio frequency transceiver device, an electrical control device and a vacuum control device;

[0091] The main control device is respectively connected with the vacuum control device and the electrical control device, and...

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Abstract

The invention discloses a device and method for measuring the influence of ion density on relative dielectric constant. The device comprises a main control device, a hollow cavity structure, a radio frequency transceiver, an electrical control device and a vacuum control device. The main control device is connected with the vacuum control device and the electrical control device. The vacuum control device, the radio frequency transceiver and the electrical control device are respectively connected with the hollow cavity structure. The vacuum control device and the electrical control device receive control signals of the main control device, change the internal state of the hollow cavity, detect plasma signal power in different ion density states through the radio frequency transceiver, calculate relative dielectric constants and analyze the influence of different ion densities on incident signal phases. The plasma density is accurately controlled. In plasma diagnosis, the influence of the ion density on the plasma dielectric constant is considered, and the problem that the influence of the ion density on the plasma dielectric constant cannot be measured is solved.

Description

technical field [0001] The invention relates to the technical field of detection of factors affecting the dielectric constant by substances, in particular to a device and a measurement method for measuring the influence of ion density on the relative dielectric constant. Background technique [0002] Plasma, also known as plasma, is an ionized gas-like substance composed of positive and negative ions generated after ionization of atoms and atomic groups after partial electron deprivation. It is a macroscopically neutral ionized gas whose scale is larger than the Debye length. Movement is dominated by electromagnetic forces and exhibits remarkable collective behavior. In low-frequency electromagnetic fields, the plasma behaves as a conductor; when the frequency of the applied electromagnetic field is high enough, the plasma behaves more like a dielectric. [0003] The dielectric constant is the most basic parameter to characterize the dielectric. It is a parameter to measur...

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Application Information

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IPC IPC(8): G01R27/26
CPCG01R27/2617
Inventor 李海龙师嘉豪王彬殷勇蒙林鲍敏
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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