A defect monitoring device for flat enameled wire production and processing
A defect monitoring and enameled wire technology, used in measuring devices, optical testing of flaws/defects, insulation of conductors/cables, etc., can solve problems such as low repair efficiency, and achieve the effect of high integration and high efficiency
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[0059] Next, the technical solutions in the embodiments of the present invention will be apparent from the embodiment of the present invention, and it is clearly described, and it is understood that the described embodiments are merely embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, there are all other embodiments obtained without making creative labor without making creative labor premises.
[0060] The present invention provides Figure 1-8 A defect monitoring device for the production and processing of flat lacquer lines, including flat painted clause defect monitoring body 1, flat painted wire defect monitoring body 1 in a cylindrical structure, the middle portion of the flat painted wire defect monitoring body 1 is provided with a length direction The processing flow hole 2, the processing flow hole 2 penetrates the two ends of the flat painted wire defect monitoring body 1, the processing flow hole 2 is wear...
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