A Mixed Signal Test Device Based on Graphical Control

Abstract

The invention discloses a mixed-signal test device based on graphic control, which adopts the Tester-On-board architecture, and expands a power generation measurement unit, an analog waveform generation acquisition unit, and an analog waveform control unit on a digital waveform graphic generation measurement board. unit, the logic control unit is used to generate and measure the digital graphics of the SOC chip to be detected, realize the generation and acquisition of digital waveforms, and control the analog waveform control unit to realize the generation and acquisition control of analog waveforms of the SOC chip to be detected. Control the power generation and measurement unit to realize the power generation acquisition control of the SOC chip to be detected, and realize the simultaneous parallel execution of the digital graphic generation measurement, analog waveform generation acquisition control, and power generation acquisition control of the SOC chip to be detected. The invention not only has simple resource coordination control, but also has high efficiency.

Description

technical field [0001] The invention relates to a graphically controlled mixed-signal testing device, which belongs to the fields of ATE (Auto Test Equipment), integrated circuit automatic testing equipment, semiconductor manufacturing, instrumentation, mixed-signal chip testing and the like. Background technique [0002] With the development of the Internet of Things and intelligence, more and more SOC chips integrate MCU control units and ADC / DAC analog generation and acquisition modules. At the same time, the price of consumer SOC chips is getting lower and lower. The requirements are also getting stricter. The existing platforms with medium and high speed digital-analog mixed-signal testing capabilities are basically monopolized by foreign equipment companies, and the equipment is expensive. Analysis of foreign semiconductor equipment companies' mixed-signal test solutions is basically completed by three functional boards: one is a digital waveform graphic generation me...

AI Technical Summary

Problems solved by technology

[0003] Since the resources required for the test are on three independent boards, the system resource requirements are high, the machine is bulky, and the cost of test equipment is high.

When testing mixed-signal chips, it is necessary to write control functions for the three boards. The programming is complicated, and the test efficiency of static parameters and dynamic parameters is low, which leads to very cumbersome and low-efficiency resource coordination and control required for mixed-signal testing. Make it difficult to reduce the cost of equipment

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