Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A method and system for improving multi-star parallel testing capability

A test system and satellite test technology, which is applied in the aerospace field, can solve the problems of high cost and difficulty in large-scale manufacturing of spacecraft, and achieve the effects of reducing construction time, standardizing satellite test process management, and reducing test personnel

Active Publication Date: 2022-07-01
SHANGHAI LIZHENG SATELLITE APPL TECH CO LTD
View PDF13 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The design and manufacture of spacecraft has its special features. Due to the diversity, complexity, and high cost of space missions, it is difficult to achieve large-scale manufacturing of spacecraft. Even in the current satellite constellation plan, different batches There are differences in function and design between satellites in the same batch and different orbital positions in the same batch, which brings great challenges to the parallel testing of satellites

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A method and system for improving multi-star parallel testing capability
  • A method and system for improving multi-star parallel testing capability
  • A method and system for improving multi-star parallel testing capability

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0071] At present, the efficiency of satellite ground testing is low, and the capabilities of testing equipment are constantly improving. However, the testing system formed by ground equipment is still continuing the traditional design method. Each satellite corresponds to a set of dedicated testing systems, which results in ground testing resources. The mass production and launch of commercial satellites, especially microsatellites, is the trend of space satellite technology development. If the traditional ground test method is still used, a large number of ground equipment and testers must be configured. The design and manufacture of spacecraft have their own special features. Due to the diversity, complexity, and high cost of space missions, it is difficult for spacecraft to achieve large-scale manufacturing. Even the currently proposed satellite constellation plan, different batches There are differences in function and design of satellites in the same batch of satellites a...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a system and method for improving the multi-satellite parallel test capability, including: a standardized test interface module: a plurality of satellites are connected with satellite ground test equipment through a standardized test interface; a test hardware resource pool module: abstracted from the satellite ground test equipment Obtain the test hardware resource pool for the virtualized instrument unit; test software system layer module: the test software system layer manages and dynamically allocates the test hardware resource pool, and obtains the resource allocation path used by multiple stars in parallel. By adopting the software-based method of hardware resources, the present invention abstracts all available resources such as hardware equipment and multiple measurement channels in the equipment into multiple test elements required for test system modeling, and solves the problem of low utilization rate of hardware resources .

Description

technical field [0001] The invention relates to the field of aerospace technology, in particular, to a method and a system for improving the multi-satellite parallel test capability, and more particularly, to a ground system design method for improving the multi-satellite parallel test capability. Background technique [0002] A method and system for improving multi-satellite parallel testing capabilities, which are mainly used in the design and development of commercial microsatellite ground parallel testing systems. mode to enable parallel testing of commercial satellites. [0003] Parallel testing of commercial satellites is one of the key technologies for the specific application of parallel testing technology in the aerospace field. The design and manufacture of spacecraft have their own special features. Due to the diversity, complexity, and high cost of space missions, it is difficult for spacecraft to achieve large-scale manufacturing. Even the currently proposed sa...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G05B23/02
CPCG05B23/0262G05B2219/24065
Inventor 李勤毅刘胜丁顺彭攀
Owner SHANGHAI LIZHENG SATELLITE APPL TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com