Method for processing local dead pixels of superconducting tape in high-temperature superconducting narrow pile line

Abstract

The invention relates to a method for processing local dead pixels of a superconducting tape in a high-temperature superconducting narrow pile line, and the method comprises the following steps: S1, measuring the critical current of each part of a to-be-measured second-generation high-temperature superconducting tape, and enabling an area where the critical current is reduced to be 80% or less to be a local dead pixel area of the to-be-measured superconducting tape; S2, attaching the superconducting tape face to face: additionally selecting a second-generation high-temperature superconducting tape sample, and attaching the second-generation high-temperature superconducting tape sample to the to-be-tested superconducting tape containing the dead pixel area; and S3, conducting strip stacking and packaging, specifically stacking the to-be-tested second-generation high-temperature superconducting tape to which the second-generation high-temperature superconducting tape sample is attached and a metal strip, and then packaging the to-be-tested second-generation high-temperature superconducting strip and the metal strip into a narrow pile line by using a packaging machine, so as to form a superconducting interlayer by the second-generation high-temperature superconducting tape sample selected in the S2 . According to the method disclosed by the invention, the part, containing the dead pixels, of the superconducting tape is reserved, the superconducting interlayer is introduced, the critical current value of the narrow heaping line is also increased, and the method has higher applicability in a high-current environment.

Description

technical field [0001] The invention belongs to the technical field of superconducting technology, and in particular relates to a method for treating local bad points of superconducting strips in a high-temperature superconducting narrow stack line. Background technique [0002] A plurality of second-generation high-temperature superconducting strips and other metal material strips are packaged into a high-temperature superconducting narrow stack line by stacking, tinning, and other processes. This line has better current-carrying capacity than superconducting thin films. and higher physical strength. But before encapsulating superconducting tapes into narrow stacks, it is necessary to measure their critical currents and identify parts containing dead pixels. The critical current measurement methods of the second-generation high-temperature superconducting strip include electrical measurement and magnetic measurement. In order to obtain the critical current of each region ...

AI Technical Summary

Problems solved by technology

However, the patent applied for in this paper is to retain the original bad part, and adopt the method of making "superconducting interlayer" to alleviate the problem of a sharp drop in critical current caused by bad points.

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