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Information processing method, device and equipment in hardware-in-loop test

An information processing method and an information processing device technology, which are applied in the field of information processing in hardware-in-the-loop testing, to achieve the effect of improving efficiency and accuracy

Pending Publication Date: 2021-11-09
BEIJING ELECTRIC VEHICLE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] Embodiments of the present invention provide an information processing method, device and equipment in hardware-in-the-loop testing to solve the problem of how to automatically fill in the field information in the BUG template

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  • Information processing method, device and equipment in hardware-in-loop test
  • Information processing method, device and equipment in hardware-in-loop test
  • Information processing method, device and equipment in hardware-in-loop test

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Embodiment Construction

[0047] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.

[0048] Aiming at the problem of how to automatically fill in field information in a BUG template, the present invention provides an information processing method, device and equipment in hardware-in-the-loop testing.

[0049] Such as figure 1 As shown, the embodiment of the present invention provides an information processing method in a hardware-in-the-loop test, the method comprising:

[0050] Step 11, obtaining the defect BUG template of the failed test case selected by the test client;

[0051] Step 12: Determine the first field information of the BUG template according to the association relationship between the BUG template and the failed test case, and automatically fill in the fields of the BUG template.

[0052] It should be noted that wh...

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Abstract

The invention provides an information processing method, device and equipment in hardware-in-loop test, and relates to the field of hardware-in-loop test. The information processing method in the hardware-in-the-loop test comprises the following steps: acquiring a defect BUG template of a failed test case selected by a test user side; and determining first field information of the BUG template according to an association relationship between the BUG template and the failed test case, and automatically filling a field of the BUG template. According to the technical scheme, the information is extracted from the test case, automatic filling of the BUG template is achieved, meanwhile, due to the fact that the field information in the BUG template is directly extracted from the failed test case, efficiency is improved, and accuracy is also improved.

Description

technical field [0001] The invention relates to the field of hardware-in-the-loop testing, in particular to an information processing method, device and equipment in the hardware-in-the-loop testing. Background technique [0002] With the increasing shortage of petroleum energy and the deterioration of the atmospheric environment, electric vehicles are favored by people because of their high efficiency and zero pollution advantages. Electric vehicles have three core controllers, namely the vehicle controller (Vehicle Control Unit, VCU) unit, the motor controller (Motor Control Unit, MCU) unit and the battery management (Battery Management System, BMS) unit. At present, the electronic control test is tested through the hardware-in-the-loop test system. The template of the test case is basically fixed, and because of the particularity of the business, almost all bugs are associated with the test case. When a test engineer submits a bug, a considerable part of the workload is...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06F40/186
CPCG06F11/3684G06F40/186
Inventor 韩薇
Owner BEIJING ELECTRIC VEHICLE
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