Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Domain mapping simple gamma calculation method for fringe projection contour measurement

A technology of contour measurement and fringe projection, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve problems such as complex solutions, achieve accurate three-dimensional measurement results, reduce phase errors, and reduce the number of projected fringes.

Pending Publication Date: 2021-11-12
武汉费雪克劳德科技有限公司
View PDF0 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Gamma and phase are calculated simultaneously, and Zhang et al. proposed an algorithm to obtain gamma by fitting the measured response curve, which is generated by projecting a series of images of different intensities. In addition, some gamma calculation algorithms A general precision distortion model was constructed to reduce the number of extra fringe images. During projection, if the projected fringe pattern couples nonlinearity and ambient light noise together, the solution may be more complicated. Yu et al. will wrap the phase The characteristics of the probability distribution function and the gamma of each system are linked, and the gamma is detected from the simulated package phase by solving the correlation of the corresponding curves, regardless of the complex model analysis of the fringe pattern
[0004] However, this approach uses a one-to-one calculation of gamma and wrap phase maps, requiring generation of more wrap curves to match tiny gamma values

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Domain mapping simple gamma calculation method for fringe projection contour measurement
  • Domain mapping simple gamma calculation method for fringe projection contour measurement
  • Domain mapping simple gamma calculation method for fringe projection contour measurement

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0032] like Figure 1-3 , a domain-mapped simple gamma calculation method for fringe projection profilometry, first needs to build a database with encoded different gammas, calculate a series of wrapped phases encoded with different gammas, and then transform them into units by domain mapping Points on the circular space, the present invention uses the Euclidean distance between adjacent points to measure the relationship between adjacent points, there is no n...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a domain mapping simple gamma calculation method for fringe projection profile measurement, wherein the method comprises the following steps: step 1, generating a series of three-step phase shift fringe patterns for coding different gamma values through a computer, and calculating wrapped phases through a phase shift method; step 2, mapping the wrapped phase values to a unit circle; step 3, solving a nearest neighbor index; step 4, performing fitting by using a Gaussian function; and step 5, describing a Gaussian curve by using a Gaussian parameter combination value. According to the algorithm, the wrapped phases are mapped to the unit circle. By analyzing a wrapped phase diagram with a gamma interval of 0.001, it can be seen that nonlinear distribution of the wrapped phases is regular, the nonlinear distribution can be converted into nearest neighbor exponential distribution of the unit circle, and small gamma differences can be distinguished.

Description

technical field [0001] The invention relates to the technical field of structural optics three-dimensional measurement, in particular to a domain mapping simple gamma calculation method for fringe projection profile measurement. Background technique [0002] Fringe projection profilometer is a typical non-contact 3D optical surface measurement method, which plays an important role in many fields such as industrial manufacturing, entertainment and medical treatment; usually, a phase shift algorithm is used to obtain an accurate absolute phase map containing depth information of the object , however, the intensity response of digital projectors and cameras is non-linear in order to obtain a better visual experience, the non-linear response of the equivalent gamma transformation is usually called the gamma effect, due to the gamma effect, the captured fringe pattern has a non-linear Linear distortion, which causes periodic phase errors and corrugated surfaces on 3D point clouds...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/06
CPCG01B11/06
Inventor 伍世虔邓高旭徐正勤郑超兵王洪亮
Owner 武汉费雪克劳德科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products