Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Extra-high voltage pipe gallery loop contact resistance test system

A technology of contact resistance and testing system, which is applied in the direction of grounding resistance measurement, measurement of resistance/reactance/impedance, and measurement devices, etc. It can solve the problems of large thermoelectric potential error of current sensor, inability to support contact resistance measurement, and small output capacity, etc., to achieve High precision, automatic measurement, low temperature effect

Pending Publication Date: 2021-11-30
JIANGSU POWER TRANSMISSION & DISTRIBUTION CO LTD +1
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The existing loop resistance tester has a small output capacity, a narrow range, and large errors caused by the thermal potential of the current sensor, which cannot support the measurement of the contact resistance of the GIL conductive pipe gallery that requires a large current.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Extra-high voltage pipe gallery loop contact resistance test system
  • Extra-high voltage pipe gallery loop contact resistance test system
  • Extra-high voltage pipe gallery loop contact resistance test system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] The technical solution of the present invention will be further described below in conjunction with the accompanying drawings.

[0020] refer to figure 1 , according to the embodiment of the present invention, the contact resistance testing system of UHV pipeline gallery circuit includes a constant current source 100 , a sampling unit 200 , a data processing controller 300 , a main controller 400 and a human-computer interaction unit 500 . Wherein the human-computer interaction unit 500 and the data controller are electrically connected with the main controller 400, the input terminal of the sampling unit 200 is connected in series with the GIL main circuit to be tested and the constant current source 100 to form a loop, and the output terminal of the sampling unit 200 is connected with the data processing The controller 300 is electrically connected. The constant current source 100 is a program-controlled constant current source 100, electrically connected to the main...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an extra-high voltage pipe gallery loop contact resistance test system. The system comprises a constant current source, a sampling unit, a data processing controller, a main controller and a man-machine interaction unit, wherein the current sampling sensor of the sampling unit is a fluxgate sensor, the constant current source is a program-controlled constant current source, and the current output upper limit of the constant current source is greater than or equal to 300A. According to the extra-high voltage pipe gallery loop contact resistance test system of the technical scheme, the fluxgate sensor is high in precision and low in temperature drift, the temperature potential problem is avoided, and the system is suitable for the GIL pipe gallery loop contact resistance which can only be measured through large current; and the program-controlled constant current source can output current which is large enough and can be controlled by the main controller, so that the measurement requirement of the contact resistance of the main loop of the GIL pipe gallery is met, and automatic measurement is realized.

Description

technical field [0001] The invention relates to the field of electrical equipment, in particular to a contact resistance testing system for a UHV pipe gallery circuit. Background technique [0002] GIL (Gas Insulated Metal Enclosed Transmission Line), uses metal conductive rods to transmit electricity, and seals them in a grounded metal shell, which is insulated by pressure gas. Compared with conventional cables, it has significant advantages such as large transmission capacity, low loss, high level of personal safety, polar electromagnetic field, unaffected by the environment, high operational reliability, space saving, no electrical (heat) aging, etc., especially suitable for dislocation overhead Supplementary power transmission technology in the case of limited power transmission mode or cable transmission, and its investment cost and maintenance cost are lower than that of cables. [0003] The GIL pipe gallery circuit is formed by plugging multiple conductive rods. To c...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/20
CPCG01R27/205
Inventor 邓福亮顾红波潘仁东孙紫君
Owner JIANGSU POWER TRANSMISSION & DISTRIBUTION CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com