A Feature-Based Process Parameter Optimization and Quality Control Method for Blisks
A quality control method, the technology of the overall blisk, applied in the direction of overall factory control, overall factory control, program control, etc., can solve the problems that cannot solve the problem of stress concentration, optimization of the overall blisk processing parameters and quality control methods, and processing deformation. and surface quality control difficulties, etc., to achieve the effect of dimensional accuracy and shape satisfaction
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0039] The present invention adopts the technical means of simulation, by extracting the processing characteristics of blades, flow channels, and radial plates of the blisk, and combining common processing strategies such as blisk contour milling and plunge milling, it proposes parameters for controlling the cutting force in the direction of the weakly rigid force. The optimization method is used to achieve the goal of quality control of the overall blisk machining of aero-engines.
[0040] This patent takes an integral blisk of an aero-engine as an example, and further explains the present invention in conjunction with the accompanying drawings and the implementation process.
[0041] A feature-based overall blisk processing parameter optimization and quality control method, the steps are as follows:
[0042] 1) Input part model;
[0043] 2) Complete the part process route analysis;
[0044] For the overall blisk of the fourth stage of an engine, the processing machine adop...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More - R&D
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com



