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Optical path orthogonal optimization method for atomic spin inertial measurement system

An inertial measurement and atomic spin technology, applied in steering induction equipment and other directions, can solve the problems of unable to find the optimal orthogonal point of system sensitivity, lack of research and practice research, and high system requirements, to reduce errors, improve signal-to-noise ratio, The effect of high sensitivity

Pending Publication Date: 2021-12-17
BEIHANG UNIV
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Problems solved by technology

[0003] At present, there are mainly two traditional methods for adjusting the orthogonality of the pumping light and the detection light: one is to directly observe and judge with the naked eye through an infrared observation mirror. The optimal orthogonal point where the system sensitivity reaches the maximum; another method is to observe the output light intensity of the pumping light after passing through the gas chamber, and compare it with the pumping light intensity before entering the gas chamber, so that the minimum transmittance is the optimal work point, although this method can guarantee to work at the point of maximum sensitivity, it needs to monitor the light intensity of the pumping light before and after passing through the gas chamber, which has high requirements on the system and low versatility
[0004] To sum up, with the development and popularization of atomic spin magnetic field\inertial measurement technology, the optical path orthogonal system design for atomic spin inertial measurement system has broad prospects, but the research practice in this area is still relatively lacking.

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  • Optical path orthogonal optimization method for atomic spin inertial measurement system
  • Optical path orthogonal optimization method for atomic spin inertial measurement system
  • Optical path orthogonal optimization method for atomic spin inertial measurement system

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Embodiment Construction

[0028] Below with the accompanying drawings ( figure 1 ) and Examples illustrate the present invention.

[0029] figure 1 It is a schematic flowchart of implementing an optical path orthogonal optimization method for an atomic spin inertial measurement system of the present invention. refer to figure 1 As shown, an optical path orthogonal optimization method of an atomic spin-inertial measurement system is characterized in that, after adjusting the SERF atomic spin-inertial measurement system to a normal working state, the detection light frequency is adjusted to the resonance frequency of a far-detuned alkali metal atom And apply a gradient magnetic field to depolarize the nuclei, and then operate the pumping light to obtain the position information of the pumping light corresponding to several orthogonal points through the law that the pumping light and the detection light are orthogonal when the system output signal is zero and the pumping light pointing information, the...

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Abstract

The invention discloses an optical path orthogonal optimization method for an atomic spin inertial measurement system. According to the method, an atomic spin inertial measurement system is taken as a research object, and a pumping light and detection light orthogonal optimization scheme is established aiming at the problem that pumping light and detection light are not orthogonal. The frequency of the detection light is adjusted to the resonant frequency of far-detuned alkali metal atoms. After a gradient magnetic field is applied to depolarize nucleons, the position and direction of the pumping light are adjusted through instantaneous switching-on and switching-off of the pumping light until an output signal is zero, and the position and direction information of a group of pumping light, namely a group of orthogonal points, can be found. Meanwhile, the system works in a magnetometer state, and an orthogonal point enabling the magnetic field response to reach the maximum is found. According to the method, the output signal of the system is used as an evaluation standard of light path orthogonality, errors caused when an intermediate parameter is used as the evaluation standard are reduced, and the sensitivity can be maximized while the requirement for making detection light and pumping light orthogonal is met.

Description

technical field [0001] The invention relates to an optical path orthogonal technology, in particular to an optical path orthogonal optimization method for an atomic spin inertial measurement system, which can be applied to an atomic spin inertial measurement device. The optical path orthogonal refers to the orthogonality of pumping light and detection light . Background technique [0002] In recent years, atomic spin inertial measurement system has become an important development direction of a new generation of high-precision inertial measurement system. The atomic spin inertial measurement system requires that the pumping light and detection light be orthogonal. Working in the orthogonal state of the pumping light and the detection light is the basic requirement for accurate measurement, especially for the ultra-high precision atomic spin inertial measurement system, the non-orthogonality will greatly limit the sensitivity of the inertial measurement system. In order to ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01C19/60
CPCG01C19/60
Inventor 王卓袁琪范文峰黄炯庞昊颖刘祀浔
Owner BEIHANG UNIV
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