On-line X-ray fluorescence analyzer light path device capable of being automatically adjusted and using method

Abstract

The invention provides an on-line X-ray fluorescence analyzer light path device capable of being automatically adjusted and a using method. The on-line X-ray fluorescence analyzer light path device is characterized in that a crystal table and a crystal holder are arranged in a light splitting shell; a light splitting crystal is arranged on the crystal holder; the crystal holder is connected with the crystal table through a shaft pin; and the crystal holder can rotate. The rotation angle of the crystal holder is adjusted by controlling the rotation of a rotating shaft through a motor, the rotation angle of the crystal holder is indirectly recorded through a multi-circle absolute value encoder, and the optimal rotation angle of the crystal holder is determined by processing the spectrum shape of counting rate-rotation angle. The light path is automatically adjusted by controlling the motor. The effect of the whole light path is optimal. The situation that the analysis precision of an instrument is reduced due to the influence of adverse factors such as environment temperature change and vibration is avoided. The maintenance workload is reduced, and manual adjustment can be carried out without opening an instrument device.

Description

technical field [0001] The invention relates to the field of on-line analysis of industrial material components, in particular to an automatically adjustable on-line X fluorescence analyzer optical path device and a use method. Background technique [0002] X-ray fluorescence spectroscopy is a fast, non-destructive method of measuring matter. X-ray fluorescence is secondary X-rays excited when materials are bombarded with high-energy X-rays or gamma rays. This phenomenon is widely used in elemental analysis and chemical analysis, especially in the investigation and research of metals, glass, ceramics and building materials, geochemistry, forensic science, archaeology and artworks such as oil paintings and murals. [0003] X-ray fluorescence spectrometer, also known as XRF spectrometer, is divided into two types: dispersive type and non-dispersive type. The dispersion type is divided into wavelength dispersion type and energy dispersion type. The wavelength dispersive fluo...

AI Technical Summary

Problems solved by technology

Due to the precise structure of the spectroscopic system of the wavelength dispersion analyzer, it is currently suitable for laboratory analysis. However, if it is used for industrial online detection and analysis, due to the harsh conditions of some industrial production sites, such as large fluctuations in ambient temperature and continuous Vibration or large amplitude, etc., have seriously affected the application effect of the wavelength dispersion analyzer in the industrial field

[0006] In particular, after the wavelength dispersion analyzer has been operated in the industrial field for a period of time, with the influence of temperature changes and vibrations, the reflective focusing state of the spectroscopic crystal on the X-fluorescence will change, which will reduce the effective X-fluorescence intensity received by the detector and affect the analysis. precision

The current maintenance method for this kind of phenomenon is that the staff disassemble the analyzer and use manual adjustments, and the site is subject to unfavorable conditions such as large moisture, dust, and narrow space, which makes debugging very difficult

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