Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Sample random extraction equipment for integrated circuit test

An integrated circuit and sample technology, which is applied in the field of sample random extraction equipment, can solve problems such as sticking angle, easy adsorption of a large number of samples, and affecting the efficiency of random sampling inspection, so as to increase the adsorption force and improve the efficiency of extraction inspection.

Inactive Publication Date: 2021-12-28
蔡文敢
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The production specifications of integrated circuit samples are different. When the extraction equipment is used to randomly extract many samples placed idle, the suction port has adsorption force on the samples to clamp them up. Due to the different specifications of the sheet samples, the adsorption force The suction force is different, which will cause the sample to swing under the force and then enter the extraction device, and there will be a corner phenomenon inside it, and some samples with small weight are easy to be adsorbed in large quantities, resulting in too much random extraction, which affects random sampling test efficiency work

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Sample random extraction equipment for integrated circuit test
  • Sample random extraction equipment for integrated circuit test
  • Sample random extraction equipment for integrated circuit test

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0031] as attached figure 1 to attach Figure 7 Shown:

[0032] The invention provides a sample random sampling device for integrated circuit testing, the structure of which is provided with a support column 1, a carriage 2, a moving device 3, a slider 4, and a total motor 5, and the carriage 2 is embedded and installed on the support column 1 above, the mobile device 3 is fixedly connected to the slider 4, the slider 4 is slidingly connected with the carriage 2, the total motor 5 is fixedly installed on one side of the carriage 2, and the mobile device 3 passes through the sliding Block 4 moves above the carriage 2 .

[0033] The moving device 3 is provided with a limit frame 31, a driver 32, a positioning block 33, a pendulum plate 34, and a random extraction device 35, and the driver 32 is fixedly connected to a side end position of the limit frame 31, and the positioning The block 33 is connected with the limit frame 31 and is slidably matched. The swing driving plate 3...

Embodiment 2

[0041] as attached Figure 8 to attach Figure 9 Shown:

[0042] Wherein, the stop block q33 is provided with a tough bar c1, a top block c2, and a bayonet block c3, the top block c2 is embedded and connected to the bottom of the tough bar c1, and the bayonet block c3 is connected to the top of the tough bar c1 and Movable cooperation, the tough rod c1 is a rubber rod structure with a certain toughness, its outer peripheral end is wound with a spring, the top block c2 is a silicone material in the state of a hemispherical block, and the bayonet block c3 is in the shape of a ball shape, and has good toughness and deformation, the tough rod c1 drives the top block c2 and the bayonet block c3 to move in the same direction, and has a reset force under the action of its outer peripheral spring, and the deformation of the bayonet block c3 is convenient for it to be supported by the upper After the adsorption force acts, it tends to deform vertically, which facilitates the circulat...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses sample random extraction equipment for integrated circuit test. The structure is provided with a supporting column, a sliding frame, a moving device, a sliding block and a main motor, wherein the sliding frame is fixedly embedded above the supporting column, the moving device is fixedly connected to the sliding block, and the moving device is transversely placed when a movable body is subjected to adsorption force; an opening blocking state is formed at the position above the inner side of the suction opening by a certain distance, the oppositely-arranged air cushions make contact with each other and abut against each other, the air cushions are flexibly changed under cooperation of the air cushions and the fold pieces, transverse placement of the solid plate is not hindered due to too large friction of the front end of the solid plate, a vertical through diameter structure is formed between every two hoses, air flow circulation is facilitated, an adsorption effect is formed below the movable body, integrated circuit samples can be sucked up, balanced suction force is applied to the samples, and therefore it is guaranteed that only one circuit board is sucked, uniform suction force is applied to the samples of different specifications and sizes, and the situation that when the suction force is different, the sheet-shaped samples tilt and are clamped into the suction device, and the extraction work efficiency is reduced is avoided.

Description

technical field [0001] The invention belongs to the technical field of integrated circuit testing, and more specifically relates to a sample random sampling device for integrated circuit testing. Background technique [0002] With the development of science and technology, integrated circuits, as miniature electronic devices, are ubiquitous in modern production and life. After the production of integrated circuits, acceptance testing is still required. Usually, random sampling and testing of many integrated circuit samples is performed using sample random sampling equipment. , to estimate the pass rate. [0003] Based on the inventor's discovery above, the existing sample random sampling equipment for integrated circuit testing has the following deficiencies: [0004] The production specifications of integrated circuit samples are different. When the extraction equipment is used to randomly extract many samples placed idle, the suction port has adsorption force on the sampl...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/04B25J9/00B25J9/02B25J15/06
CPCG01N1/04B25J9/00B25J9/02B25J15/0616
Inventor 蔡文敢
Owner 蔡文敢
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products