X-ray diffraction analysis rotary sample table for assembling vertical goniometer

Abstract

The invention discloses an X-ray diffraction analysis rotary sample table for assembling a vertical goniometer. The X-ray diffraction analysis rotary sample table comprises a clamping frame and a connecting frame, the clamping frame is composed of a clamping plate and two clamping strips formed by extending the left side edge and the right side edge of the clamping plate towards the front portion, the connecting frame is of a square frame structure with an opening in the rear portion, and a mounting plate is arranged on the front portion of the connecting frame. A round hole is formed in the mounting plate, the clamping frame and the connecting frame are connected through a bolt, the bolt between the clamping frame and the connecting frame is sleeved with a spring, a sample frame is mounted on the round hole, a connecting rod is arranged at the bottom of the sample frame and penetrates through the round hole, a driving device is mounted on the lower surface of the mounting plate, and the connecting rod is connected with the driving device. An objective table is mounted on the sample frame. According to the rotary sample table, the defects in the prior art are overcome, the rotary sample table can adapt to the analysis environment of a rotary test in a vertical goniometer, meanwhile, other parts of the sample table are prevented from generating interference signals within a conventional analysis angle range, and the test effect is improved.

Description

technical field [0001] The invention relates to the technical field of X-ray diffraction analysis sample racks, in particular to a rotating sample stage for X-ray diffraction analysis used for assembling a vertical goniometer. Background technique [0002] X-ray powder diffraction analysis is widely used in materials, chemistry, environment, geology and many other disciplines. Its main function is to identify the crystal structure and phase type of solid materials. At present, the function of this type of analysis has also made great progress. It can target A variety of sample types realize the analysis of crystal structure and the determination of the percentage of phases in materials. [0003] The main material tested by conventional X-ray diffraction analysis is in a powder state, and the shape of many powder particles deviates greatly from the ideal state (needle shape, flake shape, etc.), which is prone to preferred orientation during the preparation of conventional pow...

AI Technical Summary

Problems solved by technology

The rotating sample table needs to integrate multiple system components such as machinery, electricity, and control, and its structure is relatively complicated; while most of the goniometer sample holders of compact X-ray diffractometers are for conventional powder testing, the sample during the test The stage itself also needs to move in the plane of the focus circle, and the increase in the form of motion increases the difficulty in the design of the rotating sample stage.

[0004]At present, in the field of X-ray diffractometer rotating sample stage design, the common optimization target is the θ-θ goniometer whose sample position is fixed during the analysis process. The fine-tuning component design of the sample position is carried out by using the fixed feature of the sample stage, and less consideration is given to the fixation of the sample stage, the difficulty of equipment modification, ease of use, and the scattering of X-rays by the sample stage itself; The design and optimization of the rotating sample stage for low-power compact powder diffraction equipment equipped with a vertical goniometer has not yet been reported.

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