Unlock instant, AI-driven research and patent intelligence for your innovation.

Method and system for determining low-frequency reference frequency point of integrated circuit full-wave electromagnetic simulation

An integrated circuit and electromagnetic simulation technology, applied in the field of electromagnetic simulation, can solve problems such as inaccurate results and inability to accurately calculate the electromagnetic field distribution of integrated circuits, and achieve the effect of solving the failure problem

Active Publication Date: 2022-05-31
北京智芯仿真科技有限公司
View PDF9 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At the critical frequency point and below the frequency, the result obtained by the solution must be inaccurate, that is to say, at this time, under the current calculation accuracy, the electromagnetic field distribution of the integrated circuit cannot be accurately calculated using any sparse matrix solver

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for determining low-frequency reference frequency point of integrated circuit full-wave electromagnetic simulation
  • Method and system for determining low-frequency reference frequency point of integrated circuit full-wave electromagnetic simulation
  • Method and system for determining low-frequency reference frequency point of integrated circuit full-wave electromagnetic simulation

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0058] As shown in FIG. 1 , the method disclosed in this embodiment includes the following steps 100 to 400.

[0059] In step 100, the critical frequency point of the full-wave electromagnetic simulation of the integrated circuit is obtained.

[0067] Step 121, establishing the electromagnetic field wave equation based on Maxwell's equations. Specifically, step 121 first uses the wheat

[0068]

[0070] Step 122, obtain the corresponding homogeneous equation of the electromagnetic field wave equation, obtain the functional of the homogeneous equation.

[0071]

[0074]

[0076] Step 124, based on the basic geometry unit formed by the grid division, the electromagnetic field solution region is discretized,

[0077]

[0083]

[0085]

[0086]

[0087]

[0090]

[0092]

[0100] After constructing the matrix equation of formula (12a), for the medium type lossless dispersion and lossy dispersion

[0103] Therefore, equation (12b) is a matrix equation for a lossless medium.

[0106] In...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

This application discloses a method and system for determining the low-frequency reference frequency point of integrated circuit full-wave electromagnetic simulation. The method first obtains the critical frequency point of the full-wave electromagnetic simulation of the integrated circuit, and then calculates the critical frequency point based on the dielectric loss type of the integrated circuit. field solution, and then calculate the relative error based on the dielectric loss type and the field solution, and finally based on the size relationship between the relative error and the preset error threshold lower limit and error threshold upper limit and based on the lower limit and upper limit of the iteration frequency, The reference frequency point is calculated in an iterative manner. This method can calculate the reference frequency point and the field solution under the reference frequency point by iterative method based on the critical frequency point, so that the electromagnetic field simulation field solution at which frequency is obtained must be accurate, and it is necessary for the subsequent calculation of the real field solution at low frequencies. Field solution support makes it possible to completely solve the failure problem of existing solvers in the low frequency case for integrated circuits.

Description

Method and system for determining low-frequency reference frequency point of integrated circuit full-wave electromagnetic simulation technical field The application relates to the technical field of electromagnetic simulation, particularly to the low-frequency reference frequency point determination of integrated circuit full-wave electromagnetic simulation. methods and systems. Background technique [0002] VLSI has an obvious multi-scale structure, and its scale ranges from centimeter-level (10-2m) to nanometers. level (10‑9m), with a scale range of up to 7 orders of magnitude. On the other hand, the signals transmitted by integrated circuits often have full-wave transmission characteristics. characteristics, its transmission frequency range covers from DC to several GHz, this problem should be used in integrated circuits for digital and mixed-signal transmission Especially in use. Therefore, the electromagnetic field analysis for integrated circuits requires full-...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/23
CPCG06F30/23Y02E60/00
Inventor 王芬
Owner 北京智芯仿真科技有限公司