Combined pad type stepped key phase debugging device and debugging method
A technology of stepped and combined pads, which is applied in the direction of measuring devices, instruments, measuring electricity, etc., can solve the problem of sensor probe damage and other problems, and achieve the effect of easy portability
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[0046] Such as Figure 1-3As shown in , the combined pad-type stepped key phase adjustment device includes the first pad 1, the second pad 2 and the third pad 3 whose thickness increases sequentially, and the first pad 1 is embedded in the second pad 2 And it is rotatably connected with it, the first spacer 1 can be rotated so that part of it can be placed outside the second spacer 2, the second spacer 2 is embedded in the third spacer 3 and connected with it in rotation, the second spacer 2 can be rotated so that Part of it is placed outside the third cushion block 3. When the first cushion block 1 and the second cushion block 2 are respectively at the limit position of the one end of the embedded rotation, the first cushion block 1, the second cushion block 2 and the third cushion block 3 form a rectangular parallelepiped; when the thickness of the first spacer 1 needs to be used for debugging, the first spacer 1 is rotated out, and the first spacer 1 is placed between the r...
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