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Test system and method for RapidIO protocol device

A test system and test method technology, applied in the direction of test/monitor control system, general control system, electrical test/monitor, etc., can solve the problem that low-speed digital test cannot meet the test requirements of RapidIO protocol devices, and achieve high accuracy and operation. handy effect

Pending Publication Date: 2022-02-11
西安太乙电子有限公司
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  • Abstract
  • Description
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Problems solved by technology

[0004] Aiming at the technical problems existing in the prior art, the present invention provides a test system and method for RapidIO protocol devices to solve the technical problem that existing low-speed digital tests cannot meet the testing requirements for RapidIO protocol devices

Method used

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  • Test system and method for RapidIO protocol device
  • Test system and method for RapidIO protocol device
  • Test system and method for RapidIO protocol device

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Experimental program
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Embodiment

[0051] The present embodiment provides a kind of test system that is used for RapidIO protocol device, comprises test board, mixed signal test system UltraFlex and high-speed differential serial bus; The test board is provided with to-be-tested RapidIO protocol device and preset chip; Present embodiment Among them, the test board adopts a PCB board; the RapidIO protocol device to be tested is a C6678 chip.

[0052] The preset chip adopts the Flash S29GL064N11TAIV2 chip, which is used to save the original code of the test conditions; the input terminal of the RapidIO protocol device to be tested is connected to the mixed-signal test system UltraFlex through a high-speed differential serial bus.

[0053] The RapidIO protocol device to be tested is connected to the preset chip; the RapidIO protocol device to be tested can perform PRBS encoding on the input pulse signal and output the PRBS code;

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Abstract

The invention discloses a test system and method for a RapidIO protocol device. The test system comprises a test board, a mixed signal test system UltraFlex and a high-speed differential serial bus, a preset chip and a RapidIO protocol device to be tested are arranged on the test board, and the RapidIO protocol device to be tested is connected with the preset chip; the RapidIO protocol device to be tested is connected with the mixed signal test system UltraFlex through a high-speed differential serial bus; a PRBS code output by the RapidIO protocol device to be tested is obtained, and a signal eye pattern is obtained; and a test result is obtained according to the signal eye pattern. According to the invention, the test requirements of a RapidIO protocol device and a mixed signal test system UltraFlex can be met; manual data processing is not needed, and the accuracy of test results is high.

Description

technical field [0001] The invention belongs to the technical field of testing high-speed protocol devices, in particular to a testing system and method for RapidIO protocol devices. Background technique [0002] With the development of semiconductor technology, the core speed (GHz) of most processing chips can reach highs of millions of instructions per second (MIPS), million multiply-accumulate per second (MMAC) and billion floating-point operations per second (GFLOP). Performance capabilities; while the core speed of processor chips is getting faster and faster, faster and higher-speed controller interfaces are required to transmit massive data between the core and the outside of the chip; traditional PCI interfaces, USB interfaces, UART interfaces, and SPI interfaces And low-speed interfaces such as I2C interface are far from meeting the demand for massive data exchange. [0003] RapidIO technology is an interconnection technology based on protocol packet format, which ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B23/02
CPCG05B23/0213G05B2219/24065
Inventor 杜勇陈桐高超王佳
Owner 西安太乙电子有限公司
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