Time-resolved X-ray diffraction measurement device and method

Abstract

The invention relates to an X-ray diffraction measuring device applied to impact dynamics microscopic response experimental diagnosis, in particular to a time-resolved X-ray diffraction measuring device and method. The technical problem that an existing pulse X-ray diffraction device is insufficient in diagnosis time resolution capacity in the shorter time scale impact dynamics response process is solved. The time-resolved X-ray diffraction measurement device is based on a multi-microstrip X-ray image intensifier and comprises a pulse X-ray source, an X-ray modulation unit, a measurement target chamber, a crystal bracket, a crystal sample, an impact loading window, a piezoelectric sensor and a time-resolved X-ray imaging detector, the impact loading window triggers the crystal sample to generate impact waves to trigger the piezoelectric sensor, the piezoelectric sensor triggers the pulse X-ray source to emit X-rays, the X-rays pass through the X-ray modulation unit, enter a measurement target chamber and are incident to the crystal sample, diffraction light of the crystal sample is incident to a multi-microstrip X-ray image intensifier, and an optical signal generated by the fluorescent screen is recorded by the image recording device.

Description

technical field [0001] The invention relates to an X-ray diffraction measuring device applied to shock dynamic microscopic response experiment diagnosis, in particular to a time-resolved X-ray diffraction measuring device and method based on a multi-microstrip X-ray image intensifier. Background technique [0002] Shock phenomena exist widely in nature. However, there is still no complete knowledge and understanding of the propagation process of shock waves in solids and the material response under shock loading. The main reason is that the time and space resolution capabilities of existing experimental diagnostic devices are insufficient. In the past experimental research, the main development and formation of the shock sample recovery analysis technology and macro-on-line measurement technology. The former analyzes the microstructure of the impact recovery sample to speculate and judge the dynamic behavior of the sample, but cannot realize real-time measurement under dynam...

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to overcome the technical problem that the existing pulsed X-ray diffraction device is insufficient in diagnosing the time resolution of the impact dynamic response process on a shorter time scale, and to provide a time-resolved X-ray diffraction measurement device to achieve a shorter time-scale The time-resolved measurement of the dynamic diffraction signal in the shock dynamic response process of the scale (sub-nanosecond to nanosecond), the time resolution can reach the sub-ns level, and at the same time, the sequential dynamic diffraction image of the crystal sample can be obtained in one shock loading experiment

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