LED crystal grain appearance detection method

Abstract

The invention discloses an LED (light-emitting diode) crystal grain appearance detection method, which comprises the following steps of: performing optical detection on an LED crystal grain to obtain an appearance parameter document; dividing the LED crystal grains into first qualified crystal grains, first unqualified crystal grains and suspicious crystal grains according to the appearance parameter document; obtaining a picture of a suspicious crystal grain, and judging the appearance defect type of the suspicious crystal grain according to the picture of the suspicious crystal grain; and dividing the suspicious crystal grains into second qualified crystal grains and second unqualified crystal grains according to the types of the appearance defects. According to the detection method, re-judgment is carried out in the wafer stage, the unqualified crystal grains can be picked out in time, the situation that the unqualified crystal grains are sorted and arranged on the finished square pieces is avoided, the step of manual visual inspection is omitted, and then a large amount of manpower and microscope cost are saved.

Description

technical field [0001] The invention relates to the technical field of light-emitting diodes, in particular to a method for detecting the appearance of LED grains. Background technique [0002] After the LED wafer completes electrical parameter testing, appearance automatic optical inspection (Automated Optical Inspection, AOI), and wafer good product sorting, the same grade of die on the LED wafer is selected on the square wafer, and finally the finished square die needs to be checked. Manual visual re-inspection is performed on the appearance of the AOI inspection, and the abnormal grains missed by the AOI inspection are removed to ensure that the appearance of each grain meets the quality requirements for shipment. [0003] Since the AOI detection ability cannot be 100%, a small part of abnormal grains will be selected on the square sheet, so it needs to be re-inspected manually through a microscope. This method consumes a lot of manpower and microscope equipment, which i...

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Problems solved by technology

[0003] Since the AOI detection ability cannot be 100%, a small part of abnormal grains will be selected on the square sheet, so it needs to be re-inspected manually through a microscope. This method consumes a lot of manpower and microscope equipment, which is to remove 1 % of unqualified grains, but need to check 100% of finished grains, equivalent to 99% of the time is useless work, which greatly affects efficiency and labor costs

[0004] In addition, due to the limited field of view of the microscope, it is easy to miss and pick by mistake in the way of manual microscope picking, resulting in abnormal crystal grains not being picked out, resulting in abnormal quality

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