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Method for simultaneously obtaining particles with different gray levels in inclusion analysis system

An analysis system and technology for inclusions, applied in the analysis of materials, material analysis using wave/particle radiation, acquisition/identification of microscopic objects, etc., can solve the problems of identification difficulties, adhesion of other substances, etc., and achieve faster and more accurate particle analysis sex enhancing effect

Pending Publication Date: 2022-03-29
欧波同科技产业有限公司
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  • Abstract
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  • Claims
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Problems solved by technology

[0006] The present invention aims to provide a method for simultaneously obtaining particles of different gray scales in an inclusion analysis system, which overcomes the deficiencies in the prior art. Other inclusions have different substances, but are widely distributed in the sample, and often adhere to other substances, causing difficulty in identification. In this case, several different gray levels are set to cover the gray levels of common substances to be analyzed, so as to remove the background Finally, the particles are extracted and synthesized according to these gray scales, so as to avoid the situation that particles of different gray scales stick together and be identified as one particle, so that the accuracy of the final particle analysis results is improved.

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  • Method for simultaneously obtaining particles with different gray levels in inclusion analysis system
  • Method for simultaneously obtaining particles with different gray levels in inclusion analysis system
  • Method for simultaneously obtaining particles with different gray levels in inclusion analysis system

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Embodiment Construction

[0028] The technical solutions of the present invention will be clearly and completely described below in conjunction with specific embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0029] The embodiment of the present invention is applied in the "automatic recognition system for inclusions in aluminum alloys". The particles are eutectic silicon (mainly composed of silicon) and other metal impurities, mostly synthetic substances composed of iron, aluminum, silicon, titanium, boron, etc. and various salts. After applying this method, the measurement speed has been increased by 50%, the amount of program code has been reduced by 20%, the program has been greatly simplifie...

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Abstract

The invention belongs to the technical field of electron microscope substance recognition and analysis, and particularly relates to a method for simultaneously obtaining particles with different gray scales in an inclusion analysis system, which is characterized in that several different gray scales are set to cover the gray scales of common substances to be analyzed, and after the background is removed, the particles are subjected to secondary extraction and synthesis according to the gray scales to obtain the particles with different gray scales. And the condition that the particles with different gray levels are adhered together and identified as one particle is avoided. Compared with the prior art, the method has the beneficial effects that in an automatic identification system for the inclusions in the aluminum alloy, due to the fact that the gray scale of the eutectic silicon is different from that of other inclusions but the eutectic silicon is widely distributed in a sample, after the identification method is adopted, the system can accurately identify the eutectic silicon and the other inclusions at the same time, and the identification accuracy of the inclusions in the aluminum alloy is improved. The accuracy of a particle analysis result is remarkably improved, and the particle analysis speed is also improved.

Description

technical field [0001] The invention belongs to the technical field of electron microscope material identification and analysis, and in particular relates to a method for simultaneously obtaining different gray scale particles in an inclusion analysis system. Background technique [0002] The automatic substance identification and analysis system of the electron microscope generally first collects the BSE image frame of the sample through the electron microscope API, then manually sets the gray value to distinguish the foreground and background of the image, and then removes the background pixels through pixel-by-pixel processing, and finally realizes the particle identification through the connection algorithm. identify. After identifying the position of the particle, the elemental composition of the particle is collected by X-ray energy spectrum. Finally, the identification of particulate matter is realized. [0003] The above method can identify the situation that the f...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N15/00G01N23/2251G01N23/00G06V20/69
CPCG01N15/00G01N23/2251G01N23/00G01N2223/401
Inventor 高士鹏皮晓宇
Owner 欧波同科技产业有限公司