Electrical impedance tomography sensor suitable for microchannel foreign substance detection
A tomography and foreign matter technology, applied in the direction of material resistance, can solve the problems of difficulty in the detection of foreign matter in microchannels, and achieve the effect of being conducive to mass production, reducing the influence of contact resistance, and reducing errors
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[0028] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0029] The purpose of the present invention is to provide an electrical impedance tomography sensor suitable for detection of foreign substances in microchannels. Based on electrical impedance tomography (EIT) technology, a micro-double-layer electrode array structure is designed, using glass-silicon The chip-glass structure is processed and realized, which solves the problem of difficult realization of EIT in micro-channel foreign matter detection at a micro s...
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