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Ontology-based CMM probe diameter intelligent reasoning method

A reasoning method and probe technology, applied in the direction of reasoning methods, geometric CAD, special data processing applications, etc., to achieve the effect of easy promotion

Pending Publication Date: 2022-04-22
GUILIN UNIV OF ELECTRONIC TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In summary, there is still a lack of an ontology-based intelligent reasoning method for CMM probe diameters

Method used

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  • Ontology-based CMM probe diameter intelligent reasoning method
  • Ontology-based CMM probe diameter intelligent reasoning method
  • Ontology-based CMM probe diameter intelligent reasoning method

Examples

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Embodiment Construction

[0041] The following is a specific example of the present invention, which shows the automatic generation of the probe diameter intelligent reasoning type. However, the present invention is not limited to these examples.

[0042] Step 1: Establish a 3D model of the part in the software UG10.0 based on MBD technology, and the individual marks are as follows image 3 As shown, the ontology model of part geometric information and non-geometric information is constructed, such as Figure 4 shown.

[0043] After step 1, proceed to step 2.

[0044] Step 2: Knowing the number of fluctuations per revolution, wave height and probe diameter, construct the data attribute of the number of fluctuations per revolution, that is, FLU=15, 50, 150, 500; construct the data attribute of wave height, that is, WT=2.5 , 5, 10, 20, 40, 80; construct the data attribute of the probe diameter, that is, PRO=0.025, 0.1, 1, 2, 3, 5, 8, 20, 50.

[0045] After step 2, proceed to step 3.

[0046] Step 3:...

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Abstract

The invention belongs to the field of product precision measurement and computer application, and relates to an intelligent reasoning method for the probe diameter of an intelligent three-coordinate measuring machine (CMM), which can be used for carrying out part error measurement in CMM equipment and providing guidance for intelligent measurement. The method is realized by the following steps: step 1, acquiring annotation information in a three-dimensional model, and constructing an ontology model; 2, constructing data attributes of the fluctuation frequency, the wave height and the probe diameter of each revolution; step 3, constructing a relationship between the fluctuation frequency and the wave height of each revolution and the diameter of the probe and the diameter of the probe; 4, constructing an inference rule of the diameter of the probe; and 5, developing an intelligent reasoning program of the probe diameter by using a Java language, wherein the intelligent reasoning program is used for automatically generating the probe diameter.

Description

technical field [0001] The invention belongs to the field of product precision measurement and computer application, and relates to an intelligent three-coordinate measuring machine (Coordinate Measuring Machine, CMM) probe diameter intelligent reasoning method, which can be used for part error measurement in CMM equipment, and provides intelligent measurement guide. Background technique [0002] During the manufacturing process of parts, there must be manufacturing errors in the size, geometric shape and relative position of geometric elements. Due to the rapid development of computer technology and the demand for artificial intelligence in mechanical design and manufacturing, the research on intelligent inspection of parts manufacturing errors has become a trend. At this stage, for the inspection of part errors, the mechanical probe of CMM often uses a ball-type probe needle, which often acts as a mechanical filter when performing surface measurement. If the diameter of ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/17G06N5/04G01B21/00G01B21/24G01B21/30
CPCG06F30/17G06N5/04G01B21/00G01B21/24G01B21/30
Inventor 黄美发刘廷伟刘振辉
Owner GUILIN UNIV OF ELECTRONIC TECH
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