High-speed serial RapidIO general test system and method

Abstract

The invention belongs to the technical field of radar testing, and discloses a high-speed serial RapidIO universal testing system and method. The system provided by the invention comprises a general RapidIO tester, a general RapidIO test adapter and a general VPX bus test plug-in box, the universal RapidIO tester is used for providing a plurality of paths of X1 mode serial RapidIO test channels; the universal RapidIO test adapter comprises a plurality of VPX bus connectors, and realizes signal transfer between a RapidIO signal of the tested UUT and a test channel of the RapidIO tester; the universal VPX bus test plug-in box provides a working power supply for the tested UUT and is connected with a backboard, and signals of a front connector and a rear connector of a test slot position are in full butt joint according to a VPX bus standard definition. According to the invention, the general test problem of the high-speed digital circuit module RapidIO based on the VPX bus in a radar system can be solved.

Description

technical field [0001] The invention belongs to the technical field of radar testing, in particular to a high-speed serial RapidIO universal testing system and method. Background technique [0002] RapidIO technology is an international standard for point-to-point embedded system interconnection. It provides efficient and reliable interconnection and data exchange for high-performance embedded processor systems and embedded systems. It is widely used in modern communication systems and radars. Waiting for electronic weapons and equipment. High-speed serial RapidIO technology is a branch of RapidIO technology. At present, most mainstream embedded processor system designs use serial RapidIO technology. [0003] In the actual test, RapidIO is very complex and diverse in the actual electronic system application. Even in the same system, there are many varieties of UUT, the RapidIO bus signals are distributed on different connectors of the VPX bus, and the data transmission rate...

AI Technical Summary

Problems solved by technology

[0004] 1. The test methods are not uniform, each module adopts its own test and debugging program, and the cost of test process development is high;

[0005] 2. Limited by the interconnection topology of the system, special modules or special interface modules must be used to complete the test, and special subracks must be used. It is very complicated to build a test system, and the design cost of the test system is high. Each special module or special interface module requires There are special test methods and test processes, and the cost of test process development is high

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