Spectral emissivity measuring device and surface temperature measuring method

Abstract

The invention discloses a spectral emissivity measuring device and a surface temperature measuring method, and belongs to the technical field of radiation temperature measurement and emissivity measurement. The device is mainly composed of a lens and a spectrograph or a spectrum radiometer, and the lens and the spectrograph or the spectrum radiometer can be directly connected or can be connected through an optical fiber. No other extra temperature measuring equipment or sensor is needed, only a spectrograph or a spectral radiometer which is needed by emissivity measurement, provided with a lens and covers short waves in the spectral range is used as measuring equipment, and three or more pieces of spectral radiation energy information are used. According to the Planck black body radiation law, the relation between the target temperature and the spectral radiation energy is established, the relation between the temperature T and the spectral radiation energy L lambda and the relation between the temperature T and the wavelength lambda are fitted, the surface temperature of the target can be accurately measured and calculated, and therefore the spectral emissivity of the target is obtained. According to the invention, temperature measurement equipment can be simplified, and the measurement precision of the target spectral emissivity can be improved.

Description

technical field [0001] The invention relates to a spectral emissivity measurement device and a surface temperature measurement method, and belongs to the technical fields of radiation temperature measurement technology and emissivity measurement technology. Background technique [0002] Material emissivity is a key thermophysical parameter that characterizes the radiation characteristics of materials, and it is of great significance to the research of infrared stealth technology for aircraft, missiles and other high-speed aircraft. Emissivity is defined as the ratio of the radiant energy of the target to the radiant energy of a black body at the same temperature. Therefore, the accuracy of target surface temperature measurement directly affects the accuracy of emissivity measurement. [0003] There are many ways to measure the target surface temperature. For materials with low temperature and good thermal conductivity, contact temperature measurement or theoretical calcula...

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Problems solved by technology

[0005] Aiming at the problems that existing multi-spectral measurement methods require additional equipment and complex calculations, one of the main purposes of the present invention is to provide a spectral emissivity measurement device, which establishes the relationship between target temperature and spectral radiation energy according to Planck's black body radiation law, Calculate the surface temperature of the target, and then obtain the spectral emissivity of the target, which can simplify the spectral emissivity measurement and temperature measurement equipment

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