Test equipment

Abstract

The invention discloses a test device. The test equipment comprises a power supply module, a voltage following circuit and a signal level conversion circuit, and the input end of the voltage following circuit is electrically connected with the output end of the power supply module so as to receive VDDIO voltage required by equipment to be tested and provided by the power supply module. The output end of the voltage following circuit is electrically connected with the voltage input end of the signal level conversion circuit, and the output voltage of the voltage following circuit changes along with the change of the input VDDIO voltage. The hardware circuit of the test equipment is improved, and on the premise that IO channel communication is established between the test equipment and the equipment to be tested, the voltage following circuit follows VDDIO voltage to supply power to the signal level conversion circuit, so that the original VDDIO voltage is not consumed, the measurement of current, energy consumption and the like of the equipment to be tested is more accurate, and the test efficiency is improved. And software algorithm correction is not needed.

Description

technical field [0001] The present application relates to the technical field of testing, and more particularly, to a testing device. Background technique [0002] At present, when the test equipment and the product to be tested are tested, it is usually necessary to control the test product to enter various working modes, and the same test equipment is often compatible with various different equipment to be tested. The basic requirement for establishing communication between the test equipment and the device under test through the IO channel is that the IO power supply voltage of the test equipment and the device under test must be the same, and the IO power supply voltage provided to the device under test is also called VDDIO voltage. The VDDIO voltage of the device under test is provided by the measuring device. The IO pin output of the MCU (control chip) in the measuring device is usually 3.3V, which is the standard LVCMOS level, but the VDDIO voltage that the device und...

AI Technical Summary

Problems solved by technology

However, there is a problem that the VDDIO test current is too large when measuring this value

In the past, the solution to the large test current of the test equipment for VDDIO was to perform later software calibration and calibration for different products to be tested after the product was completed, or use other calibration instruments to perform auxiliary calibration, so that the measured current power consumption of the test equipment VDDIO was close to This post-calibration method requires complex algorithm optimization, and nonlinear situations may occur. For example, when the IO communication rate of the device is low, the total current of VDDIO after the device is calibrated is almost equal to the current value of the test product, but in When the IO communication rate is high, the current consumption of the level conversion circuit itself increases, so that the actual VDDIO current of the test product will deviate from the test value of the test equipment, which will affect the judgment of the test result

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