Flash rapid detection device and method

Abstract

The invention discloses a rapid Flash detection device and method, and the device comprises an error correction module which is used for recognizing error position information during data reading and writing; the timing module is used for sending out a time enable signal according to a set period interval; the counting module is used for counting error counts of all the areas according to the error position information, and when the time enable signal and the idle enable signal exist at the same time, the area with the maximum count is positioned as a target area, the time enable signal is eliminated, and the counts of all the areas are reset; and the error detection module is used for backing up the data of the target area and detecting the target area after backing up, pausing the detection and retaining the backup data when the reading operation is about to be recovered, storing the detection progress, and continuing to detect the previous target area which is not detected completely when an idle enable signal appears next time, and a new target area is obtained for detection until the detection of the current target area is finished, so that local detection with adjustable frequency is realized, and the detection efficiency is improved.

Description

technical field [0001] The invention belongs to the field of storage technology, and more specifically relates to a fast detection device and method for Flash. Background technique [0002] With the development of integrated circuit technology, Flash storage module, as a long-life non-volatile storage module, has the characteristics of small size, large capacity and fast speed. The share of Flash storage module in storage module equipment is increasing year by year. [0003] With the continuous progress of the technology, the density and complexity of the Flash memory module are also increasing, so that the possibility of defects in the Flash memory module is also increasing. The inspection at the factory can correct the obvious defects, and some hidden defects It will appear in frequent erasing and writing, which will cause problems with the stored data. Although multi-layer Flash has high cost performance in terms of storage capacity and price, its reliability is constant...

AI Technical Summary

Problems solved by technology

[0003] With the continuous progress of the technology, the density and complexity of the Flash memory module are also increasing, so that the possibility of defects in the Flash memory module is also increasing. The inspection at the factory can correct the obvious defects, and some hidden defects It will appear in frequent erasing and writing, which will cause problems with the stored data

Although multi-layer Flash has high cost-effective storage capacity and price, its reliability is constantly decreasing, mainly reflected in the increase of error rate after repeated use and the decrease of lifespan.

If no detection is performed, the error rate will soon reach the upper limit of error correction, which will affect the normal operation of the storage module and degrade the performance of the storage module

Most of the current detection technologies are comprehensive detection. This method will occupy a large amount of storage module resources after leaving the factory, and the detection efficiency is not high.

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