Reading method of modulating wave for detector

Abstract

The invention provides a method for reading modulating waves for a detector, which comprises the following steps of: S1, acquiring a transmission period of an excitation wave signal and a reference period of test equipment, and acquiring a cycle value and compensation time according to the transmission period and the reference period; s2, the test equipment reads a signal once after circulating a number of reference periods and delaying compensation time, and superposes the compensation time to generate total delay; s3, judging whether the total delay is smaller than a reference period or not, if so, skipping to the step S2, and if not, skipping to the step S3; and if not, the test equipment reads the signal once after interval cycle value + 1 reference period and delay compensation time, generates new total delay after subtracting one reference period from the total delay and superposing the compensation time, and skips to the step S2. According to the invention, while the excitation wave signal of any frequency can be read, the accuracy of data reading is improved, so that the test efficiency and accuracy of the chip are ensured.

Description

technical field [0001] The invention relates to the technical field of data reading, in particular to a method for reading modulated waves used in a detector. Background technique [0002] The tester for testing the function of the chip includes a main module and a sub-module. The chip to be tested is installed on the sub-module. The main module communicates with the sub-module data through the communication port to transmit the excitation signal. When the chip tests different functions, according to the received The excitation signal configures different test environments and test incentives for the chip under test, and receives feedback. Due to the different functions of different types of test chips, the frequencies of the communication ports used are not exactly the same. The sub-module needs to accurately read the excitation signals of different frequencies. The change time of the edge or the falling edge is short. When the frequency of the excitation wave signal is to...

AI Technical Summary

Problems solved by technology

Due to the different functions of different types of test chips, the frequencies of the used communication ports are not exactly the same. The sub-module needs to accurately read the excitation signals of different frequencies. When the excitation signal transmits data through the rising or falling edge, due to the rising The change time of the edge or falling edge is short. When the excitation wave signal frequency is too high, it is easy to miss the reading, which affects the accuracy of the information read by the detector.

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