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Method for correcting sensor output

A technology of sensors and photodetectors, which is applied in the direction of methods, instruments, and scientific instruments that are compared with reference electrical parameters, can solve problems that are not suitable for quantitative measurement, and achieve the effect of fast, cheap, and fast measurement

Inactive Publication Date: 2006-02-08
ARKRAY INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Non-linear sensor, has been considered unsuitable for quantitative measurement

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0066] As a first example, figure 1 The outline of the two-dimensional reflectance measurement device is shown. This device adopts the output correction method of the first form of the present invention, and the sensor used is a zone sensor.

[0067] In the figure, 2 is the object to be measured, which is placed on the sample stand (omitted in the figure) and placed at a prescribed position. In the case of actual measurement such as a clinical examination, the object 2 to be measured is a urine test strip, an immunoassay test strip, or the like. In the case of chemical analysis, the object 2 to be measured is thin-layer chromatography or the like. When correcting the area sensor, use a white board with a uniform surface reflectance. In order to illuminate the measured object 2, as a light source, three LEDs (light-emitting diodes) 4 are arranged at the same height above the measured object 2, and the three are 120 degrees apart from each other, facing the center of the meas...

Embodiment 2

[0165] As a second example, Figure 14 An outline of a two-dimensional reflectance measuring device employing the output correction method of the second aspect of the present invention is shown. The sensor used by this device is a zone sensor.

[0166] and figure 1 Compared with the reflectance measuring device shown, the difference is that the photodetector 10 for monitoring the amount of light is not configured, and other structures are basically the same. Reflected light from the object 2 passes through the reflector 5 and the lens 6 to form an image on the area sensor 8 a. zone sensor 8a with figure 1 Amplifier 22 is shown. The detection signal of the area sensor 8a is sent to the calculation part 28a through the A / D converter 24. Calculator 28a is equivalent to figure 1 RAM26 and microcomputer 28 in. A display 30, a main keyboard 32, and a printer 34 are connected to the computing unit 28a. 36 is an image storage unit for storing the transferred image data, which ...

Embodiment 3

[0179] As a third embodiment, a method of correcting the output using the third aspect of the present invention will be described using a zone sensor.

[0180] The reflectance measurement used with Figure 14 The same device as shown.

[0181] In this embodiment, as the area sensor 8a, an element whose exposure time to light can be controlled by a program is used. As such an area sensor, use for example in figure 1 A CMOS image sensor manufactured by Mitsubishi is used in the examples. (H64283FP). However, the area sensor 8a to be used is not limited to a CMOS image sensor, and even a CCD image sensor can be used as long as the exposure time can be controlled by a program.

[0182] Although the output of the area sensor 8a has a nonlinear relationship with the received light amount, the received light amount is proportional to the exposure time. Furthermore, since the amount of light received is directly proportional to the reflectance, using one reference plate and makin...

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Abstract

Above a measuring object (2), an LEDs (4) for use in light irradiation and a CMOS area sensor (8) with an image-forming lens (6) interpolated in between are installed. In order to detect the quantity of light from the LEDs (4), a photodetector (10) is further placed. A personal computer (28) carries out a linearizing process which, upon variation of the quantity of light, corrects the output of the area sensor (8) so as to make the output from the area sensor (8) proportional to the output of the photodetector (10), and a light-irregularity correction process which, when a flat plate having even in-plane density is measured as the measuring object (2), corrects the resulting output of each pixel in the area sensor (8) that has been corrected by the linearizing process to have in-plane evenness. It becomes possible to achieve a convenient two-dimensional reflection factor measuring method which does not need any mechanical driving system.

Description

technical field [0001] The invention relates to a sensor correction method, that is, in the method of irradiating the object to be measured with light, and then using the sensor to receive the reflected light of the object to be measured for measurement, when the relationship between the output of the sensor used and the amount of light received is nonlinear , a way to modify its output. [0002] In the present invention, the light to be measured includes reflected light, transmitted light, fluorescence, phosphorescence, chemiluminescence, etc., and various lights used for quantitative measurement and qualitative measurement. Background technique [0003] Among photodetectors, there are single-element photodetectors (such as photodiodes); there are also linear sensors that line up photodetectors (such as photodiode arrays); and there are regions that arrange photodetectors in two dimensions. Sensors (such as CCD sensors and CMOS sensors). [0004] As the output characteris...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J1/44G01N21/00G01J1/32G01J1/42
CPCG01J1/124G01N21/59G01N2021/5957G01J1/1626G01N2021/5949G01N21/4738
Inventor 和田敦江川浩司
Owner ARKRAY INC