Automatic test system, device and method for ICs and overall system

A technology for integrated circuit and complete machine testing, which is applied in the direction of electronic circuit testing, semiconductor/solid-state device testing/measurement, etc. It can solve problems such as software conflicts, dynamic errors that cannot be detected, and cannot be detected, so as to improve accuracy, Test the effect of complete and accurate detection

A technology for integrated circuit and complete machine testing, which is applied in the direction of electronic circuit testing, semiconductor/solid-state device testing/measurement, etc. It can solve problems such as software conflicts, dynamic errors that cannot be detected, and cannot be detected, so as to improve accuracy, Test the effect of complete and accurate detection

CN1376932AInactive Publication Date: 2002-10-30VIA TECH INC
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  • Automatic test system, device and method for ICs and overall system
  • Automatic test system, device and method for ICs and overall system
  • Automatic test system, device and method for ICs and overall system

Examples

Experimental program
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Embodiment Construction

[0055] The automatic integrated circuit test system, device and method of the present invention are performed on a known good computer, and can be used to detect any integrated circuit in the test computer. In terms of personal computers, such as central processing units, system bus controllers, input / output bus controllers; or integrated circuits in interface modules, such as graphics accelerators. Generally speaking, these integrated circuits are configured on a printed circuit board, such as a central processing unit, a system bus controller, and an input / output bus controller are usually configured on a motherboard. Among them, the central processing unit is usually electrically connected to the motherboard by a connector, such as Socket478, Socket 423, Socket 370, Socket 7, etc. The memory integrated circuit is configured on a module circuit board, and then a connector, such as DIMM, RIMM, etc., is electrically connected to the motherboard. As for, the system bus controller a...

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Abstract

An automatic test system for testing integrated circuits (ICs) and overall system is composed of a rack, at least one computer for test purpose and arranged in said rack for carrying and testing an IC, at least one automatic connect / disconnect mechanism for plugging the IC to be tested in the testing computer or self-test computer and disconnecting it, and at least one controller for controlling the connection and disconnection of IC and its test process. After the ICs to be tested are plugged in the testing computer, it becomes a complete computer for running application and test programs and performing the test of overall system.

Description

Technical field [0001] The present invention relates to an automated integrated circuit complete machine testing system, device and method, and in particular to an automated integrated circuit complete machine testing system, device and method that can simulate the state of the end user and perform dynamic testing method. Background technique [0002] Computers have almost become one of the necessities in life for today’s humans, whether they are servers, workstations, desktop computers, notebook computers or portable computers ), or personal digital assistants, palm-topPCs, pocket PCs, or even industrial computers, have become part of most people’s daily lives. These computers are composed of many integrated circuits (ICs), and these integrated circuits must undergo complicated tests to ensure the quality of the products. [0003] Please refer to figure 1 , Is a well-known personal computer (PC) structure diagram. The well-known personal computer 100 mainly includes a central p...

Claims

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Application Information

Patent Timeline
30 Oct 2002
Publication
CN1376932A
IPC
G01R31/28; H01L21/66
Inventors
祁明仁; 郭澎嘉