Unlock instant, AI-driven research and patent intelligence for your innovation.

Single Crystal gallium nitride base board and its growth method and manufacture method

A gallium nitride substrate and growth method technology, which is applied in the field of single crystal gallium nitride substrate manufacturing, can solve the problems of increased cost, low yield of raw material gas, non-split property, etc., and achieve the effect of promoting reduction and elimination

Inactive Publication Date: 2003-03-26
SUMITOMO ELECTRIC IND LTD
View PDF6 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This will increase the cost
[0006] The above are the shortcomings when used as LED substrates. In the case of semiconductor lasers (LDs), due to the lack of cleavage, there is the problem that the end faces of laser resonators cannot be made by cleavage.
The end face of the resonator must be formed by grinding and etching, which is time-consuming
There is another disadvantage: after all, the defect density is high
But there is such a problem: it is not just completely concentrated on one point, but somewhat scattered
Here, the messy displacement caused by blooming is the first problem
[0041] The second problem is: when the displacement is concentrated at the bottom of the pit 4 formed by the concave-convex surface 6, the planar defect 10 formed at the center of the pit is at an angle of 60° to each other.
However, there are problems when trying to make thick substrate crystals instead of thin films
Since the method uses a large amount of gas, the raw material gas yield is low
For thin films, this is not a problem, but for forming substrates, the low yield is a disadvantage
There is another problem: since the raw material contains organic matter and carbon, carbon will be mixed in when GaN is formed.
But the surface does not have 3-degree symmetry

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Single Crystal gallium nitride base board and its growth method and manufacture method
  • Single Crystal gallium nitride base board and its growth method and manufacture method
  • Single Crystal gallium nitride base board and its growth method and manufacture method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0369] Embodiment 1 (sapphire substrate, Figure 11 )

[0370] The GaN substrate manufacturing method of the present invention (Embodiment 1) will be described. Manufacturing steps such as Figure 11 shown. A sapphire C-plane substrate 51 is used as the base substrate. Figure 11 (1) A sapphire substrate 51 is given. Sapphire is a trigonal crystal system, and GaN is a hexagonal crystal system. The practical LEDs and LDs exclusively use sapphire C-plane substrates.

[0371] First, a GaN oriented growth layer 52 having a thickness of about 2 μm is formed on a sapphire substrate 51 in advance by MOCVD (metal organic CVD). According to this, the surface becomes the C-plane of GaN.

[0372] Uniformly form SiO with a thickness of about 100 nm on the GaN oriented growth layer 52 2 membrane. This is for regularly disposing the seeds 53 on the GaN-oriented growth layer 52 . A desired seed 53 is formed by photolithography. Sometimes the seed pattern is also called...

Embodiment 2

[0459] Embodiment 2 (GaAs, Si, sapphire substrate, pattern A, H (A+ELO), Figure 12 )

[0460] Substrates of the following three kinds of dissimilar materials were prepared:

[0461] A. (111) plane GaAs substrate

[0462] B, C surface (0001) sapphire substrate

[0463] C, (111) plane Si substrate

[0464] Si is a cubic crystal system of diamond structure. GaAs is a cubic crystal system of zinc blende (Zinc Blende). GaN belongs to the hexagonal crystal system. Its C-plane has 3-fold rotational symmetry. In the cubic crystal system, only the (111) plane has 3 times of symmetry. Therefore, the GaAs and Si substrates adopt three-fold symmetry (111) plane substrates. Sapphire belongs to the trigonal crystal system. In order to make it grow in the c-axis direction, sapphire uses a single crystal with a C-plane (0001) as the substrate.

[0465] Figure 12 (1)-(3) show GaN crystal growth methods. In samples A-D, the top mask (SiO 2 ) material to form the s...

Embodiment 3

[0508] Embodiment 3 (mask type)

[0509] A plurality of GaAs substrates having a plane-oriented (111) As plane were prepared as the base substrate, and different thin-film seed patterns were produced on the substrates in order to check the effects of different masks (seed patterns).

[0510] Produced: Forming Si with a thickness of 0.15 μm directly on a (111) As-GaAs substrate 3 N 4 Thin film (I), Pt thin film (J) with 0.2 μm thickness, W thin film with 0.2 μm thickness (K), SiO thin film with 0.1 μm thickness 2 Thin films (L, M) obtained.

[0511] The seed pattern was created by removing part of the thin film by applying resist and then performing photolithography and etching.

[0512] For SiN thin film (I), Pt thin film (J) and W thin film, seed pattern is determined as embodiment 1 described 6 times symmetrical pattern A ( Figure 6 (a)). Pattern A is such that seeds with a diameter of 50 μm are placed at the vertices of repeated regular triangles with a ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
diameteraaaaaaaaaa
diameteraaaaaaaaaa
diameteraaaaaaaaaa
Login to View More

Abstract

The present invention provides a growth method of single crystal GaN, seeds are implanted in a regular pattern upon an undersubstrate, the roughness growth makes pits above the seeds and hold the same, meantime the GaN roughness grows then closed defect accumulating regions H is formed on bottoms of the pits, and dislocations are assembled on the same, the surrounding accompanying low dislocation single crystal regions (Z) and extra low dislocation single crystal regions (Y) surrounding the closed defect accumulating regions H are achieved. Release of dislocations is forbidden because the closed defect accumulating regions H is closed.

Description

technical field [0001] The present invention relates to single crystal gallium nitride (GaN) that can be used as a substrate of blue light emitting elements such as blue light emitting diodes (LEDs) and blue semiconductor lasers (LDs) composed of group III-V nitride semiconductors A substrate, a single crystal gallium nitride substrate (GaN) growth method, and a single crystal gallium nitride substrate (GaN) manufacturing method. Background technique [0002] Light-emitting elements using nitride-based semiconductors (InGaN, GaN) are already in practical use as blue LEDs. However, since GaN substrates with large areas cannot be obtained, insulating sapphire (α-Al 2 o 3 ) as the substrate. The LED structure was fabricated by growing GAN and INGAN films heterogeneously on the three-dimensional plane of symmetry of sapphire. Also, GAN-based LEDs using SIC substrates have been proposed and partially put into practical use. GAINN-like blue LEDs fabricated on sapphire substra...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): C30B29/38C30B25/02C30B25/18H01L21/20H01L21/205H01L33/32H01S5/323
CPCH01L21/02647H01L21/02458C30B29/406H01L21/0242H01L21/02642C30B25/02H01L21/02395C30B25/18H01L21/02433H01L21/02609H01L21/0254C30B25/183H01L21/02381H01L21/20
Inventor 元木健作冈久拓司中畑成二弘田龙上松康二
Owner SUMITOMO ELECTRIC IND LTD