Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Seal structure used for high wet sensitive electronic device element and its producing method

An electronic device and highly moisture-sensitive technology, which is applied in semiconductor/solid-state device manufacturing, electrical components, electric solid-state devices, etc., can solve problems such as unexplained drying treatment methods, prevent premature damage to devices, enhance coordination, Enhanced moisture protection

Inactive Publication Date: 2003-04-09
GLOBAL OLED TECH
View PDF9 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, Boroson et al. do not teach a method for drying the environment around composite highly moisture-sensitive electronic device components sealed within multiple enclosures

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Seal structure used for high wet sensitive electronic device element and its producing method
  • Seal structure used for high wet sensitive electronic device element and its producing method
  • Seal structure used for high wet sensitive electronic device element and its producing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0054] The term "highly moisture-sensitive electronic device component" means a component that includes one or more highly moisture-sensitive electronic devices during or after manufacture, or that includes one or more components of highly moisture-sensitive electronic devices. The term "highly moisture sensitive electronic device" refers to any electronic device that is susceptible to measurable degradation in device performance when ambient humidity levels are greater than 1000 ppm. The term "substrate" refers to an organic, inorganic, or combination of organic and inorganic solids on which one or more highly moisture-sensitive electronic devices are fabricated. The term "encapsulation" refers to an organic, inorganic, or combination of organic and inorganic solids used to protect one or more highly moisture-sensitive electronic devices from moisture by preventing or limiting moisture penetration. The term "encapsulant" refers to an organic, inorganic, or combination of org...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A highly moisture-sensitive element (14) and method of making such element includes an encapsulation enclosure (30) encapsulating all of the highly moisture-sensitive electronic devices (12) on a substrate (10) and a sealing material (20) positioned between the substrate and the encapsulation enclosure to form a partial seal (later to be filled) between the substrate (10) and the encapsulation enclosure (30) around each highly moisture-sensitive electronic device or around groups of highly moisture-sensitive electronic devices.

Description

technical field [0001] The present invention relates to the control of the internal humidity of packaged electronic devices, in particular to a highly humidity-sensitive electronic device component with multiple highly humidity-sensitive electronic devices and its manufacturing method, so as to prevent premature device damage or premature reduction of device performance. Background technique [0002] In manufacturing, electronic devices are typically fabricated by processing large substrates containing multiple electronic devices. These substrates are typically selected from glass, plastic, metal, ceramic, silicon, other semiconductor materials, or combinations thereof. The substrate can be rigid or flexible and can be processed as individual units or as a continuous roll. The main reason for fabricating multiple electronic devices on large individual substrates or continuous roll substrates is to reduce production costs by reducing operations, increasing throughput and inc...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): B01D53/26H01L23/00H01L23/26H01L23/58H01L51/52H10N99/00
CPCH01L2924/09701H01L51/5246H01L51/5253B81B7/0038H01L2251/566H01L23/26H01L2924/12044H01L51/5259H01L2924/0002H01L27/14618H01L23/10H01L23/08H01L51/5237H01L51/524H10K71/851H10K59/8722H10K59/872H10K59/874H10K59/873H01L2924/00H01L23/00H10K50/841H10K50/846H10K50/8426H10K50/844
Inventor M·L·波罗森J·施密滕多夫P·G·贝西J·P·塞尔比基
Owner GLOBAL OLED TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products