Film transistor array panel with visual checking device and its checking method

A thin-film transistor and panel technology, applied in the field of visual inspection, can solve problems such as difficult to obtain laser cutting space, difficult laser cutting, etc.

Inactive Publication Date: 2003-04-23
SAMSUNG DISPLAY CO LTD
View PDF0 Cites 19 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the method of directly forming only a part of the driver IC on the TFT panel requires expensive equipment to perform GT
[0005] In addition, since the driver IC formed on the TFT workpiece acts as an obstacle at the time of laser cutting, it is difficult to adopt laser cutting after inspection, and since the TFT panel and optical filter are formed in the same size, it is difficult to obtain space

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Film transistor array panel with visual checking device and its checking method
  • Film transistor array panel with visual checking device and its checking method
  • Film transistor array panel with visual checking device and its checking method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0039] A thin film transistor (TFT) will be described with reference to the drawings.

[0040] figure 1 are circuit diagrams according to the first and second embodiments of the present invention.

[0041] A plurality of gate lines 2 extend laterally, and a plurality of data lines 3 insulated to cross the gate lines 2 in a longitudinal direction are formed on an insulating substrate 100 . A plurality of gate pads 20 connected to the gate driver IC are connected to the first end of the gate line 2, and a plurality of data pads 30 connected to the data driver IC are connected to the second end of the data line 3 . The gate lines 2 and the data lines 3 cross each other to define pixel areas, and a group of pixel areas forms a display area. A portion other than the display area is defined as the surrounding area. A gate TFT B for inspection is connected to a third end opposite to the gate line 2 , and a data TFT A for inspection is connected to a fourth end opposite to the sec...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A plurality of gate lines and a plurality of data lines intersecting the gate lines to define a display area are formed on an insulating substrate including a display area and a surrounding area. On the surrounding area, a gate driving circuit connected to the gate lines and a logic circuit for VI interposed between the gate driving circuit and the gate line and having several first to third NOR gates are formed. A first input terminal of the first NOR gate of the logic circuit for VI is connected to an output terminal of the gate driving circuit, and a second input terminal thereof is connected to a CON1 terminal, and an output terminal thereof is connected to a first input terminal of the second or the third NOR gate. A second input terminal of the second NOR gate is connected to a CON2 terminal and an output terminal thereof is connected to the gate lines in odd number. A second input terminal of the NOR gate is connected to a CON3 terminal and an output terminal thereof is connected to the gate lines in even number.

Description

technical field [0001] The present invention relates to a thin film transistor array panel, in particular to a visual inspection (visual inspection) device and a method for performing visual inspection in a thin film transistor array panel in which a gate driving circuit is integrated. Background technique [0002] The thin film transistor array panel is used as a circuit board for independently driving each pixel in a liquid crystal display (LCD) or an organic electroluminescence (EL) display, etc. In the thin film transistor panel, scanning signal lines or gate lines, and image signal lines or data lines for transmitting image signals. Also formed are thin film transistors connected to gate lines and data lines, pixel electrodes connected to the thin film transistors, a gate insulating layer for covering and insulating the gate lines, and a gate insulating layer for covering and insulating the thin film transistors and data lines. passivation layer. ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G02F1/13G02F1/1343G02F1/1345G02F1/1362G02F1/1368H01L21/336H01L21/77H01L21/84H01L27/12H01L29/786
CPCH01L27/1214H01L27/1288H01L29/66765G02F1/13454H01L27/12G02F2001/136254H01L27/124G02F1/136254
Inventor 张龙圭李源规全珍
Owner SAMSUNG DISPLAY CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products