Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Function testing method and system for hardware watchdog

A functional testing and watchdog technology, applied in the testing field, can solve the problems of complex batch functional testing and high testing cost, and achieve the effect of low testing cost, simple and reliable technology

Active Publication Date: 2004-11-03
ZTE CORP
View PDF1 Cites 13 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the shortcomings of this patent application are: when debugging and testing the hardware watchdog function, additional hardware circuits, such as crystal oscillators and EPLDs, are required, and the test cost is relatively high; secondly, the technical solution of this patent application is only applicable to single boards The debugging of the CPU system is too complicated for batch functional testing of hardware dog chips in the production process

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Function testing method and system for hardware watchdog
  • Function testing method and system for hardware watchdog

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0019] figure 1 It is a flow chart of the test method proposed by the present invention. Such as figure 1 As shown, the function test method of the hardware watchdog proposed by the present invention includes the following steps: the first step, the test system is powered on and started. The second step is MCU initialization, including setting the registers for MCU operation. The third step is to read the contents of the designated N address units of the external RAM. The fourth step is to compare the read data with the predetermined data to determine whether they are consistent; the fifth step is to write the predetermined data into the specified N address units if they are not consistent. In the sixth step, the MCU stops the "feeding the dog" operation and delays the time T, and the time T must be greater than the limit feeding time of t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

This invention discloses a function test method and system for a hardware- watching dog including 1 starting the test system 2 initializing MCU 3 fetching content of outside RAM definite N address units 4 comparing if the fetched data are the same with the pre-designed data 5 writing the pre-designed data in the definite N address units if not the same 6. MCU stops the feeding operation, a delay time T should be larger than the limit feeding time of the watching dog chip 7 a write storage recording the hardware dog function lost to finish after instructing or reporting the test result. 8. If they are the same, the write storage registers the normal function of the dog and finishes after reporting the test results.

Description

technical field [0001] The invention relates to the testing field, in particular to a testing method and system for a hardware watchdog chip. Background technique [0002] In the application system design of CPU or MCU, in order to improve the reliability of system operation, a hardware watchdog unit is often added to its external design to prevent the system from "crashing". At present, the external hardware watchdog chip technology is relatively mature, and there are many such special chips, such as MAX706 of MAXIM Company. Electronic design and manufacturing companies design the hardware watchdog chip on the CPU small system of the single board in the research and development design to ensure the stability of the CPU system. When the CPU system is debugged and the single board is produced, it is usually necessary to test the function of the hardware watchdog to ensure that its function is normal. [0003] The Chinese patent application with the patent application number...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F1/24G06F11/30
Inventor 朱红军丁国兴李刚健姚发定吴德荣
Owner ZTE CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com