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Stripline resonator and microwave thin film material electromagnetic parameter testing device

A testing device and resonator technology, applied in resonator, material analysis using microwave means, measuring device, etc., can solve the problems of complex manufacturing process, limited testing frequency range, large testing error, etc.

Inactive Publication Date: 2006-07-12
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] When the above-mentioned network parameter method and resonant cavity perturbation method are used to test the electromagnetic parameters of microwave thin film materials, the test frequency range is limited, and broadband testing of electromagnetic parameters of microwave thin film materials cannot be realized; There are still some defects in the stability and accuracy of the measurement due to the limitations of the test method and the test method. It is difficult to obtain accurate electromagnetic parameters and the test error is large.
Most of the literature can only test the equivalent magnetic permeability of microwave thin film materials, and some of the test methods require complex samples, which is difficult to adapt to the current requirements of electromagnetic parameter testing of microwave thin film materials

Method used

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  • Stripline resonator and microwave thin film material electromagnetic parameter testing device
  • Stripline resonator and microwave thin film material electromagnetic parameter testing device
  • Stripline resonator and microwave thin film material electromagnetic parameter testing device

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Embodiment Construction

[0058] The working mode of the stripline resonator is quasi-TEM 00n Mode, the length of the resonator is 250mm, and the filling medium is air. When working mode is TEM 001 When the resonance frequency is 0.6GHz, the mode is quasi-TEM 0010 When the resonance frequency is 6.0GHz. The frequency range is 0.6~6.0GHz.

[0059] The other parts of the strip line resonator in the embodiment of the present invention are the same as those in the summary of the invention, and will not be repeated here.

[0060] The other parts of the test device in the embodiment of the present invention are the same as in the content of the invention, and will not be repeated here.

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Abstract

The disclosed stripline resonator comprises two parallel metal ground plates 4, an inner conductor 5 between two plates 4, a metal short-circuit board 6 connected to with two ends of plate 4, and two coupling loops 7 on proper position of connected part of plate 4 and conductor 5 for input / output of microwave signal. The electromagnet parameter testing device for microwave film material comprises: a microwave signal source 1, a stripline resonator 2 with broad work frequency and small volume and testing error, and a SNA 3. This device can test the parameters in different microwave frequency range.

Description

Technical field [0001] A strip line resonator and a device for testing electromagnetic parameters of microwave film materials belong to the technical field of microwave testing, and particularly relates to the test of electromagnetic parameters of microwave film materials. Background technique [0002] As a multifunctional material, the performance of microwave thin film materials must be tested by actual performance parameters. The two basic parameters describing the electromagnetic properties of microwave film materials are complex permittivity and complex permeability. They are the main basis for evaluating the electromagnetic properties of microwave film materials and are also important parameters for electromagnetic shielding design and microwave communication design. [0003] The testing of electromagnetic parameters of microwave film materials in the microwave frequency band has been carried out abroad for more than ten years, and the commonly used testing method is the ne...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01P7/08G01R27/26G01R33/12G01N22/00
Inventor 李恩郭高凤张其劭陆海鹏梁迪飞邓龙江
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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